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PDF ESD8111 Data sheet ( Hoja de datos )
| Número de pieza | ESD8111 | |
| Descripción | ESD Protection Diode | |
| Fabricantes | ON Semiconductor | |
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ESD8101, ESD8111
ESD Protection Diodes
Ultra Low Capacitance ESD Protection
Diode for High Speed Data Line
The ESD81x1 Series ESD protection diodes are designed to protect
high speed data lines from ESD. Ultra−low capacitance and low ESD
clamping voltage make this device an ideal solution for protecting
voltage sensitive high speed data lines.
Features
• Low Capacitance (0.20 pF Typ, I/O to GND)
• Protection for the Following IEC Standards:
IEC 61000−4−2 (Level 4)
• Low ESD Clamping Voltage
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
• USB 3.0/3.1
• MHL 2.0
• eSATA
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
Symbol
Value
Unit
Operating Junction Temperature Range TJ −55 to +150 °C
Storage Temperature Range
Tstg − 55 to +150 °C
Lead Solder Temperature −
Maximum (10 Seconds)
TL 260 °C
ESD8101:
IEC 61000−4−2 Contact
IEC 61000−4−2 Air
ESD8111:
IEC 61000−4−2 Contact
IEC 61000−4−2 Air
ESD
±23 kV
±23 kV
±30 kV
±30 kV
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
See Application Note AND8308/D for further description of
survivability specs.
This document contains information on some products that are still under development.
ON Semiconductor reserves the right to change or discontinue these products without
notice.
www.onsemi.com
MARKING
DIAGRAMS
ESD8101 (01005)
DSN2
CASE 152AK
T
ESD8101P (01005)
DSN2
CASE TBD*
X
ESD8111 (0201)
WLCSP2
CASE 567AV
ESD8111P (0201)
WLCSP2
CASE TBD*
T, F, X = Device Code
M = Date Code
* In Development
FM
XM
PIN CONFIGURATION
AND SCHEMATIC
12
=
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2015
August, 2015 − Rev. 1
1
Publication Order Number:
ESD8101/D
1 page  
ESD8101, ESD8111
IEC 61000−4−2 Spec.
Level
First Peak
Test Volt- Current Current at
age (kV)
(A) 30 ns (A)
1 2 7.5 4
2 4 15 8
3 6 22.5 12
48
30 16
Current at
60 ns (A)
2
4
6
8
IEC61000−4−2 Waveform
Ipeak
100%
90%
I @ 30 ns
I @ 60 ns
10%
Figure 11. IEC61000−4−2 Spec
tP = 0.7 ns to 1 ns
Transmission Line Pulse (TLP) Measurement
Transmission Line Pulse (TLP) provides current versus
voltage (I−V) curves in which each data point is obtained
from a 100 ns long rectangular pulse from a charged
transmission line. A simplified schematic of a typical TLP
system is shown in Figure 12. TLP I−V curves of ESD
protection devices accurately demonstrate the product’s
ESD capability because the 10s of amps current levels and
under 100 ns time scale match those of an ESD event. This
is illustrated in Figure 13 where an 8 kV IEC 61000−4−2
current waveform is compared with TLP current pulses at
8 A and 16 A. A TLP I−V curve shows the voltage at which
the device turns on as well as how well the device clamps
voltage over a range of current levels.
L
50 W Coax
Cable
S Attenuator
÷
50 W Coax
Cable
10 MW
IM VM
VC DUT
Oscilloscope
Figure 12. Simplified Schematic of a Typical TLP
System
Figure 13. Comparison Between 8 kV IEC 61000−4−2 and 8 A and 16 A TLP Waveforms
www.onsemi.com
5
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| PDF Descargar | [ Datasheet ESD8111.PDF ] | |
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