DataSheet.jp

HCS151D の電気的特性と機能

HCS151DのメーカーはIntersil Corporationです、この部品の機能は「Radiation Hardened 8-Input Multiplexer」です。


製品の詳細 ( Datasheet PDF )

部品番号 HCS151D
部品説明 Radiation Hardened 8-Input Multiplexer
メーカ Intersil Corporation
ロゴ Intersil Corporation ロゴ 




このページの下部にプレビューとHCS151Dダウンロード(pdfファイル)リンクがあります。

Total 9 pages

No Preview Available !

HCS151D Datasheet, HCS151D PDF,ピン配置, 機能
HCS154MS
September1995
Radiation Hardened
4-to-16 Line Decoder/Demultiplexer
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 Rads (Si)/s
• Dose Rate Upset >1010 RAD(Si)/s 20ns Pulse
• Cosmic Ray Upset Immunity < 2 x 10-9 Errors/Gate Day
(Typ)
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii 5µA at VOL, VOH
Description
The Intersil HCS154MS is a Radiation Hardened 4 to 16 line
Decoder/Demultiplexer with two enable inputs. A high on
either enable input forces the output to a high state. The
Demultiplexing function is performed by using the four input
lines A0 to A3 to select the desired output states.
The HCS154MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS154MS is supplied in a 24 lead Ceramic flatpack (K
suffix) or a SBDIP Package (D suffix).
Pinouts
24 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T24
TOP VIEW
Y0 1
Y1 2
Y2 3
Y3 4
Y4 5
Y5 6
Y6 7
Y7 8
Y8 9
Y9 10
Y10 11
GND 12
24 VCC
23 A0
22 A1
21 A2
20 A3
19 E2
18 E1
17 Y15
16 Y14
15 Y13
14 Y12
13 Y11
24 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F24
TOP VIEW
Y0 1 24
Y1 2 23
Y2 3 22
Y3 4 21
Y4 5 20
Y5 6 19
Y6 7 18
Y7 8 17
Y8 9 16
Y9 10 15
Y10 11 14
ND 12 13
VCC
A0
A1
A2
A3
E2
E1
Y15
Y14
Y13
Y12
Y11
Ordering Information
PART NUMBER
HCS154DMSR
HCS154KMSR
HCS154D/Sample
HCS154K/Sample
HCS154HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
24 Lead SBDIP
24 Lead Ceramic Flatpack
24 Lead SBDIP
24 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
1
Spec Number 518754
File Number 2479.2

1 Page





HCS151D pdf, ピン配列
Specifications HCS154MS
Absolute Maximum Ratings
Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
θJA θJC
SBDIP Package. . . . . . . . . . . . . . . . . . . . 63oC/W 23oC/W
Ceramic Flatpack Package . . . . . . . . . . . 87oC/W 23oC/W
Maximum Package Power Dissipation at +125oC Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.79W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.57W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15.9mW/oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . 11.5mW/oC
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . .100ns Max
Operating Temperature Range (TA) . . . . . . . . . . . . -55oC to +125oC
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . 0.0V to 30% of VCC
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . 70% of VCC to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETERS
Quiescent Current
SYMBOL
(NOTE 1)
CONDITIONS
ICC VCC = 5.5V,
VIN = VCC or GND
Output Current
(Sink)
IOL VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage
Current
IOH
VOL
VOH
IIN
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V
VCC = 4.5V, VIH = 3.15V,
IOL = 50µA, VIL = 1.35V
VCC = 5.5V, VIH = 3.85V,
IOL = 50µA, VIL = 1.65V
VCC = 4.5V, VIH = 3.15V,
IOH = -50µA, VIL = 1.35V
VCC = 5.5V, VIH = 3.85V,
IOH = -50µA, VIL = 1.65V
VCC = 5.5V, VIN = VCC or
GND
Noise Immunity
Functional Test
FN VCC = 4.5V,
VIH = 0.70(VCC), (Note 2)
VIL = 0.30(VCC)
GROUP
A SUB-
GROUPS
1
2, 3
1
2, 3
1
2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1
2, 3
7, 8A, 8B
TEMPERATURE
+25oC
+125oC, -55oC
+25oC
+125oC, -55oC
+25oC
+125oC, -55oC
+25oC, +125oC, -55oC
+25oC, +125oC, -55oC
+25oC, +125oC, -55oC
+25oC, +125oC, -55oC
+25oC
+125oC, -55oC
+25oC, +125oC, -55oC
NOTES:
1. All voltages reference to device GND.
2. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.
LIMITS
MIN MAX
- 40
- 750
4.8 -
4.0 -
-4.8 -
-4.0 -
- 0.1
- 0.1
VCC
-0.1
VCC
-0.1
-
-
-
-
-
±0.5
±5.0
-
UNITS
µA
µA
mA
mA
mA
mA
V
V
V
V
µA
µA
-
Spec Number 518754
3


3Pages


HCS151D 電子部品, 半導体
Specifications HCS154MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9 Table 4 (Note 1)
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
1 - 11, 13 - 17
12, 18 - 23
-
24 - -
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1 - 11, 13 - 17
12
-
18 - 24
-
-
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
-
12, 18 - 21
1 - 11, 13 - 17
24
23 22
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
1 - 11, 13 - 17
12
18 - 24
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518754
6

6 Page



ページ 合計 : 9 ページ
 
PDF
ダウンロード
[ HCS151D データシート.PDF ]


データシートを活用すると、その部品の主な機能と仕様を詳しく理解できます。 ピン構成、電気的特性、動作パラメータ、性能を確認してください。


共有リンク

Link :


部品番号部品説明メーカ
HCS151D

Radiation Hardened 8-Input Multiplexer

Intersil Corporation
Intersil Corporation
HCS151DMSR

Radiation Hardened 8-Input Multiplexer

Intersil Corporation
Intersil Corporation
HCS151HMSR

Radiation Hardened 8-Input Multiplexer

Intersil Corporation
Intersil Corporation
HCS151K

Radiation Hardened 8-Input Multiplexer

Intersil Corporation
Intersil Corporation


www.DataSheet.jp    |   2020   |  メール    |   最新    |   Sitemap