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PDF HCS151HMSR Data sheet ( Hoja de datos )
| Número de pieza | HCS151HMSR | |
| Descripción | Radiation Hardened 8-Input Multiplexer | |
| Fabricantes | Intersil Corporation | |
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HCS139MS
September 1995
Radiation Hardened Dual
2-to-4 Line Decoder/Demultiplexer
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCS139MS is a Radiation Hardened 2-to-4 line
Decoder/Demultiplexer with an active low enable (E). Data
on the select inputs (A0, A1) cause one of the four normally
high outputs to go to a low logic level. The Demultiplexing
function is performed by using the enable input as the data
input.
If the enable input is high all four outputs remain high. For
demultiplexer operation the enable input is the data input.
The enable input also functions as a chip select when these
devices are cascaded.
The HCS139MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS139MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Pinouts
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
TOP VIEW
E1 1 1
A0 1 2
A1 1 3
Y0 1 4
Y1 1 5
Y2 1 6
Y3 1 7
GND 8
16 VCC
15 2 E
14 2 A0
13 2 A1
12 2 Y0
11 2 Y1
10 2 Y2
9 2 Y3
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16, LEAD FINISH C
TOP VIEW
E1
A0 1
A1 1
Y0 1
Y1 1
Y2 1
Y3 1
GND
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
VCC
2E
2 A0
2 A1
2 Y0
2 Y1
2 Y2
2 Y3
Ordering Information
PART NUMBER
HCS139DMSR
HCS139KMSR
HCS139D/Sample
HCS139K/Sample
HCS139HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
153
Spec Number 518832
File Number 3560.1
1 page  
Specifications HCS139MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
Input Leakage Current
Noise Immunity
Functional Test
Propagation Delay
A0, A1 to Output
Propagation Delay
Enable to Output
SYMBOL
(NOTES 1, 2)
CONDITIONS
IIN VCC = 5.5V, VIN = VCC or GND
FN VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 3)
TPHL,
TPLH
VCC = 4.5V
TPHL,
TPLH
VCC = 4.5V
TEMPERATURE
+25oC
+25oC
200K RAD
LIMITS
MIN MAX
- ±5
--
+25oC
2 27
+25oC
2 27
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
UNITS
µA
-
ns
ns
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
Spec Number 518832
157
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