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PDF TPCA8011-H Data sheet ( Hoja de datos )

Número de pieza TPCA8011-H
Descripción High Efficiency DC/DC Converter Applications
Fabricantes Toshiba Semiconductor 
Logotipo Toshiba Semiconductor Logotipo



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No Preview Available ! TPCA8011-H Hoja de datos, Descripción, Manual

TPCA8011-H
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TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-speed U-MOSIII)
TPCA8011-H
High Efficiency DCDC Converter Applications
Notebook PC Applications
Portable-Equipment Applications
Unit: mm
0.5±0.1 1.27 0.4±0.1
85
0.05 M A
Small footprint due to a small and thin package
High speed switching
Small gate charge: QSW =16 nC (typ.)
Low drain-source ON-resistance: RDS (ON) = 2.7 m(typ.)
High forward transfer admittance: |Yfs| =120 S (typ.)
Low leakage current: IDSS = 10 µA (max) (VDS = 20 V)
Enhancement mode: Vth = 0.6 to 1.3 V (VDS = 10 V, ID = 200 μA)
0.15±0.05
0.95±0.05
14
5.0±0.2
0.595
A
0.166±0.05
S 0.05 S
1 4 1.1±0.2
4.25±0.2
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Drain-source voltage
Drain-gate voltage (RGS = 20 k)
Gate-source voltage
Drain current
DC (Note 1)
Pulsed (Note 1)
Drain power dissipation (Tc=25)
Drain power dissipation
(t = 10 s)
(Note 2a)
Drain power dissipation
(t = 10 s)
(Note 2b)
Single-pulse avalanche energy
(Note 3)
Avalanche current
Repetitive avalanche energy
(Tc=25) (Note 4)
Channel temperature
Storage temperature range
Symbol
VDSS
VDGR
VGSS
ID
IDP
PD
PD
PD
EAS
IAR
EAR
Tch
Tstg
Rating
20
20
±12
40
120
45
2.8
1.6
208
40
2.0
150
55 to 150
Unit
V
V
V
A
W
W
W
mJ
A
mJ
°C
°C
8 5 0.8±0.1
1,2,3SOURCE 4GATE
5,6,7,8DRAIN
JEDEC
JEITA
TOSHIBA
2-5Q1A
Weight: 0.069 g (typ.)
Circuit Configuration
8765
1234
Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
1 2006-11-16

1 page




TPCA8011-H pdf
RDS (ON) – Ta
12
Common source
Pulse test
8
VGS = 2.5 V
4
VGS = 4.5 V
ID = 40 A
10, 20 A
ID = 10, 20, 40 A
0
80 40
0
40 80 120 160
Ambient temperature Ta (°C)
TPCA8011-H
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1000
100
IDR – VDS
Common source
Ta = 25°C
Pulse test
4.5
4
3
2.5
10
1 VGS = 0 V
1
0 0.2 0.4 0.6 0.8 1.0
Drain-source voltage VDS (V)
10000
Capacitance – VDS
Ciss
1000
Coss
Common source
VGS = 0 V
f = 1 MHz
Ta = 25°C
100
0.1
1
Crss
10
Drain-source voltage VDS (V)
100
Vth – Ta
2.5
Common source
VDS = 10 V
2.0 ID = 0.2 mA
Pulse test
1.5
1.0
0.5
0
80 40
0
40 80 120 160
Ambient temperature Ta (°C)
20
VDS
16
Dynamic input/output
characteristics
10
8
12 6
84
Common source
4
VGS
ID = 40 A
2
Ta = 25°C
Pulse test
00
0 10 20 30 40 50
Total gate charge Qg (nC)
5
2006-11-16

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