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PDF IS45LV44002B Data sheet ( Hoja de datos )
| Número de pieza | IS45LV44002B | |
| Descripción | DYNAMIC RAM | |
| Fabricantes | Integrated Silicon Solution | |
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IS45LV44002B
4M x 4 (16-MBIT) DYNAMIC RAM
WITH EDO PAGE MODE
ISSI®
www.DataSheet4U.com
SEPTEMBER 2005
FEATURES
• Extended Data-Out (EDO) Page Mode access cycle
• TTL compatible inputs and outputs
• Refresh Interval:
– 2,048 cycles/32 ms
• Refresh Mode: RAS-Only,
CAS-before-RAS (CBR), and Hidden
• Single power supply: 3.3V ± 10%
• Byte Write and Byte Read operation via two CAS
• Automotive Temperature Range
Option A1: -40°C to +85°C
• Lead-free available
DESCRIPTION
The ISSI IS45LV44002B is 4,194,304 x 4-bit high-performance
CMOS Dynamic Random Access Memory. These de-
vices offer an accelerated cycle access called EDO Page
Mode. EDO Page Mode allows 2,048 random accesses
within a single row with access cycle time as short as 20 ns
per 4-bit word.
These features make the IS45LV44002B ideally suited for
high-bandwidth graphics, digital signal processing, high-
performance computing systems, and peripheral
applications.
The IS45LV44002B is packaged in a 24-pin 300-mil SOJ
with JEDEC standard pinouts.
PRODUCT SERIES OVERVIEW
Part No.
IS45LV44002B
Refresh
2K
Voltage
3.3V ± 10%
PIN CONFIGURATION: 24-pin SOJ
VDD
I/O0
I/O1
WE
RAS
NC
1
2
3
4
5
6
A10
A0
A1
A2
A3
VDD
7
8
9
10
11
12
24 GND
23 I/O3
22 I/O2
21 CAS
20 OE
19 A9
18 A8
17 A7
16 A6
15 A5
14 A4
13 GND
KEY TIMING PARAMETERS
Parameter
RAS Access Time (tRAC)
CAS Access Time (tCAC)
Column Address Access Time (tAA)
EDO Page Mode Cycle Time (tPC)
Read/Write Cycle Time (tRC)
-50
50
13
25
20
84
Unit
ns
ns
ns
ns
ns
PIN DESCRIPTIONS
A0-A10
I/O0-3
WE
OE
RAS
CAS
VDD
GND
NC
Address Inputs
Data Inputs/Outputs
Write Enable
Output Enable
Row Address Strobe
Column Address Strobe
Power
Ground
No Connection
Copyright © 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
1
1 page  
IS45LV44002B
ISSI ®
www.DataSheet4U.com
ELECTRICAL CHARACTERISTICS(1)
(Recommended Operating Conditions unless otherwise noted.)
Symbol Parameter
Test Condition
Speed Min. Max. Unit
IIL Input Leakage Current
Any input 0V ≤ VIN ≤ VDD
Other inputs not under test = 0V
–5 5 µA
IIO Output Leakage Current Output is disabled (Hi-Z)
0V ≤ VOUT ≤ VDD
–5 5 µA
VOH Output High Voltage Level
IOH = –2.0 mA, VDD = 3.3V
2.4 —
V
VOL Output Low Voltage Level
IOL = 2 mA, VDD = 3.3V
ICC1 Standby Current: TTL
RAS, CAS ≥ VIH
ICC2 Standby Current: CMOS
RAS, CAS ≥ VDD – 0.2V
ICC3 Operating Current:
RAS, CAS,
Random Read/Write(2,3,4)
Address Cycling, tRC = tRC (min.)
Average Power Supply Current
ICC4 Operating Current:
RAS = VIL, CAS,
EDO Page Mode(2,3,4)
Cycling tPC = tPC (min.)
Average Power Supply Current
ICC5 Refresh Current:
RAS-Only(2,3)
RAS Cycling, CAS ≥ VIH
tRC = tRC (min.)
Average Power Supply Current
ICC6 Refresh Current:
RAS, CAS Cycling
CBR(2,3,5)
tRC = tRC (min.)
Average Power Supply Current
— 0.4
V
— 2 mA
— 0.5 mA
-50 — 120 mA
-50 — 90 mA
-50 — 120 mA
-50 — 120 mA
Notes:
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device
operation is assured. The eight RAS cycles wake-up should be repeated any time the tREF refresh requirement is exceeded.
2. Dependent on cycle rates.
3. Specified values are obtained with minimum cycle time and the output open.
4. Column-address is changed once each EDO page cycle.
5. Enables on-chip refresh and address counters.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
5
5 Page 
IS45LV44002B
READ WRITE CYCLE (LATE WRITE and READ-MODIFY-WRITE Cycles)
ISSI ®
www.DataSheet4U.com
RAS
tCRP
CAS
tASR
ADDRESS
WE
I/O
OE
Row
tRWC
tRAS
tRP
tRCD
tCSH
tRSH
tCAS tCLCH
tRAD
tRAH
tAR
tASC
tCAH
tRAL
tACH
tRCS
Column
tRWD
tCWD
tAWD
Row
tCWL
tRWL
tWP
Open
tRAC
tCAC
tCLZ
tAA
tOE
tDS tDH
Valid DOUT Valid DIN
Open
tOD tOEH
Don’t Care
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. A
09/12/05
11
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