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PDF IS61VPD102418A Data sheet ( Hoja de datos )

Número de pieza IS61VPD102418A
Descripción 512K x 36 - 1024K x 18 18Mb SYNCHRONOUS PIPELINED DOUBLE CYCLE DESELECT STATIC RAM
Fabricantes Integrated Silicon Solution 
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IS61VPD51236A IS61VPD102418A
IS61LPD51236A IS61LPD102418A
512K x 36, 1024K x 18
18Mb SYNCHRONOUS PIPELINED,
DOUBLE CYCLE DESELECT STATIC RAM
ISSI®
www.DataSheet4U.com
FEBRUARY 2006
FEATURES
• Internal self-timed write cycle
• Individual Byte Write Control and Global Write
• Clock controlled, registered address, data and
control
• Burst sequence control using MODE input
• Three chip enable option for simple depth
expansion and address pipelining
• Common data inputs and data outputs
• Auto Power-down during deselect
• Double cycle deselect
• Snooze MODE for reduced-power standby
• JTAG Boundary Scan for PBGA package
• Power Supply
LPD: VDD 3.3V + 5%, VDDQ 3.3V/2.5V + 5%
VPD: VDD 2.5V + 5%, VDDQ 2.5V + 5%
• JEDEC 100-Pin TQFP and 165-pin PBGA
package
• Lead-free available
DESCRIPTION
The ISSI IS61LPD/VPD51236A and IS61LPD/
VPD102418Aarehigh-speed,low-powersynchronous static
RAMs designed to provide burstable, high-performance memory
for communication and networking applications. The
IS61LPD/VPD51236A is organized as 524,288 words by 36
bits, and the IS61LPD/VPD102418A is organized as
1,048,576 words by 18 bits. Fabricated with ISSI's ad-
vanced CMOS technology, the device integrates a 2-bit
burst counter, high-speed SRAM core, and high-drive capa-
bility outputs into a single monolithic circuit. All synchro-
nous inputs pass through registers controlled by a positive-
edge-triggered single clock input.
Write cycles are internally self-timed and are initiated by the
rising edge of the clock input. Write cycles can be one to four
bytes wide as controlled by the write control inputs.
Separate byte enables allow individual bytes to be written.
The byte write operation is performed by using the byte
write enable (BWE) input combined with one or more
individual byte write signals (BWx). In addition, Global
Write (GW) is available for writing all bytes at one time,
regardless of the byte write controls.
Bursts can be initiated with either ADSP (Address Status
Processor) or ADSC (Address Status Cache Controller)
input pins. Subsequent burst addresses can be generated
internally and controlled by the ADV (burst address
advance) input pin.
The mode pin is used to select the burst sequence order,
Linear burst is achieved when this pin is tied LOW.
Interleave burst is achieved when this pin is tied HIGH or
left floating.
FAST ACCESS TIME
Symbol
tKQ
tKC
Parameter
Clock Access Time
Cycle Time
Frequency
250 200 Units
2.6 3.1
ns
4 5 ns
250 200 MHz
Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability
arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any
published information and before placing orders for products.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
02/03/06
1

1 page




IS61VPD102418A pdf
IS61VPD51236A, IS61VPD102418A, IS61LPD51236A, IS61LPD102418A
ISSI ®
www.DataSheet4U.com
165 PBGA PACKAGE PIN CONFIGURATION
1M X 18 (TOP VIEW)
1 2 3 4 5 6 7 8 9 10 11
A NC
A
CE
BWb
NC
CE2
BWE ADSC ADV
A
A
B NC
A
CE2
NC
BWa
CLK
GW
OE
ADSP A
NC
C NC
NC
VDDQ
Vss
Vss
Vss
Vss
Vss
VDDQ
NC
DQPa
D NC
DQb
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
NC
DQa
E NC
DQb
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
NC
DQa
F NC
DQb
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
NC
DQa
G NC
DQb
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
NC
DQa
H NC Vss NC VDD Vss Vss Vss VDD NC NC ZZ
J
DQb
NC
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
DQa
NC
K DQb NC
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
DQa
NC
L DQb NC
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
DQa
NC
M DQb NC
VDDQ
VDD
Vss
Vss
Vss
VDD
VDDQ
DQa
NC
N DQPb NC
VDDQ
Vss
NC
A
Vss
Vss
VDDQ
NC
NC
P NC NC A A TDI A1* TDO A A A A
R MODE NC
A
A
TMS A0*
TCK A
A
A
A
Note: * A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired.
PIN DESCRIPTIONS
Symbol
A
A0, A1
ADV
ADSP
ADSC
GW
CLK
CE
CE2
CE2
BWx (x=a,b)
Pin Name
Address Inputs
Synchronous Burst Address Inputs
Synchronous Burst Address
Advance
Address Status Processor
Address Status Controller
Global Write Enable
Synchronous Clock
Synchronous Chip Select
Synchronous Chip Select
Synchronous Chip Select
Synchronous Byte Write
Controls
Symbol
BWE
OE
ZZ
MODE
TCK, TDO
TMS, TDI
NC
DQa-DQb
DQPa-Pb
VDD
VDDQ
Vss
Pin Name
Byte Write Enable
Output Enable
Power Sleep Mode
Burst Sequence Selection
JTAG Pins
No Connect
Data Inputs/Outputs
Data Inputs/Outputs
Power Supply
Output Power Supply
Ground
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
02/03/06
5

5 Page





IS61VPD102418A arduino
IS61VPD51236A, IS61VPD102418A, IS61LPD51236A, IS61LPD102418A
ISSI ®
www.DataSheet4U.com
OPERATING RANGE (IS61LPDXXXXX)
Range
Commercial
Industrial
Ambient Temperature
0°C to +70°C
–40°C to +85°C
VDD
3.3V + 5%
3.3V + 5%
VDDQ
3.3 / 2.5V + 5%
3.3 / 2.5V + 5%
OPERATING RANGE (IS61VPDXXXXX)
Range
Commercial
Industrial
Ambient Temperature
0°C to +70°C
–40°C to +85°C
VDD
2.5V + 5%
2.5V + 5%
VDDQ
2.5V + 5%
2.5V + 5%
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol
VOH
VOL
VIH
VIL
ILI
ILO
Parameter
Test Conditions
Output HIGH Voltage
IOH = –4.0 mA (3.3V)
IOH = –1.0 mA (2.5V)
Output LOW Voltage
IOL = 8.0 mA (3.3V)
IOL = 1.0 mA (2.5V)
Input HIGH Voltage
Input LOW Voltage
Input Leakage Current Vss VIN VDD(1)
Output Leakage Current Vss VOUT VDDQ,
OE = VIH
3.3V
Min. Max.
2.4 —
— 0.4
2.0 VDD + 0.3
-0.3 0.8
-5 5
-5 5
2.5V
Min. Max.
2.0 —
Unit
V
— 0.4
V
1.7 VDD + 0.3
-0.3 0.7
-5 5
-5 5
V
V
µA
µA
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter
Test Conditions
-250
MAX
Temp.range x18 x36
-200
MAX
x18 x36
Unit
ICC AC Operating
Device Selected,
Com. 450 450 425 425
Supply Current
OE = VIH, ZZ VIL,
Ind. 500 500 475 475
All Inputs 0.2V or VDD – 0.2V,
Cycle Time tKC min.
mA
ISB Standby Current Device Deselected,
TTL Input
VDD = Max.,
All Inputs VIL or VIH,
ZZ VIL, f = Max.
Com. 150
Ind. 150
150 150
150 150
150
150
mA
ISBI Standby Current Device Deselected,
Com. 110 110 110 110
CMOS Input
VDD = Max.,
Ind. 125 125 125 125
VIN VSS + 0.2V or VDD – 0.2V
f=0
mA
ISB2 Sleep Mode
ZZ>VIH
Com. 60
Ind. 75
60 60
75 75
60
75
mA
Note:
1. MODE pin has an internal pullup and should be tied to VDD or VSS. It exhibits ±100µA maximum leakage current when tied to
VSS + 0.2V or VDD – 0.2V.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
02/03/06
11

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