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PDF 3D7110 Data sheet ( Hoja de datos )

Número de pieza 3D7110
Descripción MONOLITHIC 10-TAP FIXED DELAY LINE
Fabricantes Data Delay Devices 
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No Preview Available ! 3D7110 Hoja de datos, Descripción, Manual

MONOLITHICwww.DataSheet4U.com 10-TAP
FIXED DELAY LINE
(SERIES 3D7110)
3D7110
FEATURES
PACKAGES
All-silicon, low-power CMOS technology
TTL/CMOS compatible inputs and outputs
Vapor phase, IR and wave solderable
Auto-insertable (DIP pkg.)
IN 1
N/C 2
O2 3
14 VDD
13 O1
12 O3
IN 1 14 VDD
N/C 2 13 O1
O2 3 12 O3
O4 4 11 O5
O6 5 10 O7
O8 6 9 O9
Low ground bounce noise
O4 4 11 O5
GND 7 8 O10
Leading- and trailing-edge accuracy
Delay range: .75 through 80ns
O6 5
O8 6
10 O7
9 O9
3D7110D SOIC
(150 Mil)
Delay tolerance: 5% or 1ns
Temperature stability: ±3% typical (0C-70C)
Vdd stability: ±1% typical (4.75V-5.25V)
Minimum input pulse width: 15% of total delay
GND 7
8 O10
3D7110 DIP
3D7110G Gull-Wing
IN 1
N/C 2
N/C 3
O2 4
16 VDD
15 N/C
14 O1
13 O3
14-pin Gull-Wing and 16-pin SOIC
available as drop-in replacements
for hybrid delay lines
For mechanical dimensions, click here.
For package marking details, click here.
O4
O6
O8
GND
5
6
7
8
12 O5
11 O7
10 O9
9 O10
3D7110S SOL
(300 Mil)
FUNCTIONAL DESCRIPTION
The 3D7110 10-Tap Delay Line product family consists of fixed-delay
CMOS integrated circuits. Each package contains a single delay line,
tapped and buffered at 10 points spaced uniformly in time. Tap-to-tap
(incremental) delay values can range from 0.75ns through 8.0ns. The
input is reproduced at the outputs without inversion, shifted in time as
per the user-specified dash number. The 3D7110 is TTL- and CMOS-
compatible, capable of driving ten 74LS-type loads, and features both
rising- and falling-edge accuracy.
The all-CMOS 3D7110 integrated circuit has been designed as a
reliable, economic alternative to hybrid TTL fixed delay lines. It is offered
in a standard 14-pin auto-insertable DIP and space saving surface
mount 14- and 16-pin SOIC packages.
PIN DESCRIPTIONS
IN
O1
O2
O3
O4
O5
O6
O7
O8
O9
O10
VDD
GND
Delay Line Input
Tap 1 Output (10%)
Tap 2 Output (20%)
Tap 3 Output (30%)
Tap 4 Output (40%)
Tap 5 Output (50%)
Tap 6 Output (60%)
Tap 7 Output (70%)
Tap 8 Output (80%)
Tap 9 Output (90%)
Tap 10 Output (100%)
+5 Volts
Ground
Doc #96005
12/2/96
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
1

1 page




3D7110 pdf
www.DataSheet4U.com
3D7110
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V
)
Pulse Width:
Delay
PWIN = 1.25 x Total
Period:
Delay
PERIN = 2.5 x Total
Device
Under
Test
OUTPUT:
Rload:
Cload:
Threshold:
10K
470
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Digital
Scope
5pf
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
OUT1
OUT2
IN
DEVICE UNDER
TEST (DUT)
OUT3
OUT4
OUT5
OUT6
OUT7
OUT8
OUT9
OUT10
REF
IN DIGITAL SCOPE/
TRIG TIME INTERVAL COUNTER
Figure 2: Test Setup
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
tRISE
PWIN
PERIN
tFALL
INPUT
SIGNAL
2.4V
1.5V
0.6V
tPLH
VIH
2.4V
1.5V
0.6V
VIL
tPHL
OUTPUT
SIGNAL
1.5V
VOH
1.5V
VOL
Doc #96005
12/2/96
Figure 3: Timing Diagram
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
5

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