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PDF HEDS-9100 Data sheet ( Hoja de datos )

Número de pieza HEDS-9100
Descripción (HEDS-xx00) Optical Encoder Modules
Fabricantes AVAGO TECHNOLOGIES 
Logotipo AVAGO TECHNOLOGIES Logotipo



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No Preview Available ! HEDS-9100 Hoja de datos, Descripción, Manual

www.DaHtaESDheSe-t54U5.0co0m, HEDS-6500 and HEDS-9000, 9100, 9200 Series
Motion Sensing Products, Optical Encoder Modules
Reliability Data
Description
The following cumulative test results have been obtained
from testing performed at Avago Technologies in accord-
ance with the latest revision of MIL- STD-883.
Avago tests parts at the absolute maximum rated con-
ditions recommended for the device. The actual per-
formance you obtain from Avago parts depends on the
electrical and environmental characteristics of your ap-
plication but will probably be better than the perform-
ance outlined in Table 1.
Table 1. Life Tests
Demonstrated Performance
Failure Rate Prediction
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The relation-
ship between ambient temperature and actual junction
temperature is given by the following:
TJ (°C) = TA (°C) + θJA PAVG
where
TA = ambient temperature in °C
θjuJAn=cttiohne-rtmoa-al mrebsiisetnatnicne°oCf/watt
PAVG = average power dissipated in watts
The estimated MTBF and failure rate at temperatures
lower than the actual stress temperature can be deter-
mined by using an Arrhenius model for temperature ac-
celeration. Results of such calculations are shown in the
table on the following page using an activation energy of
0.43 eV (reference MIL-HDBK-217).
Test Name
High Temperature
Operating Life
Temperature
Humidity
Operating Life
Stress Test
Conditions
VVT1AA0CC=0==01V5h0B.o0=5°uVC3r,s.5 V
VV1A,C0C=0=0V5Bh.=5ouV3r.s5 V
TRAH==8855°C%
Total
Device Hrs.
1,405,000
Units
Tested
1,405
1,495,000
1,495
Total
Failed
2
10
Point Typical Performance
Failure Rate
MTBF (% /1K Hours)
702,500
0.142
149,500
0.669


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