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PDF MT28F004B3 Data sheet ( Hoja de datos )

Número de pieza MT28F004B3
Descripción (MT28F004B3 / MT28F400B3) FLASH MEMORY
Fabricantes Micron Technology 
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FLASH MEMORY
4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
MT28F004B3
MT28F400B3
3V Only, Dual Supply (Smart 3)
FEATURES
• Seven erase blocks:
16KB/8K-word boot block (protected)
40-Pin TSOP Type I 48-Pin TSOP Type I
Two 8KB/4K-word parameter blocks
Four main memory blocks
• Smart 3 technology (B3):
3.3V ±0.3V VCC
3.3V ±0.3V VPP application programming
5V ±10% VPP application/production programming1
• Compatible with 0.3µm Smart 3 device
• Advanced 0.18µm CMOS floating-gate process
• Address access time: 80ns
• 100,000 ERASE cycles
44-Pin SOP
• Industry-standard pinouts
• Inputs and outputs are fully TTL-compatible
• Automated write and erase algorithm
• Two-cycle WRITE/ERASE sequence
• Byte- or word-wide READ and WRITE
(MT28F400B3, 256K x 16/512K x 8)
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• Byte-wide READ and WRITE only
(MT28F004B3, 512K x 8)
• TSOP and SOP packaging options
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OPTIONS
• Timing
80ns access
• Configurations
512K x 8
256K x 16/512K x 8
• Boot Block Starting Word Address
Top (3FFFFh)
Bottom (00000h)
• Operating Temperature Range
Commercial (0ºC to +70ºC)
Extended (-40ºC to +85ºC)
• Packages
44-pin SOP (MT28F400B3)
48-pin TSOP Type I (MT28F400B3)
40-pin TSOP Type I (MT28F004B3)
MARKING
-8
MT28F004B3
MT28F400B3
T
B
None
ET
SG
WG
VG
NOTE:
1. This generation of devices does not support 12V VPP
compatibility production programming; however, 5V VPP
application production programming can be used with no
loss of performance.
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Part Number Example:
MT28F400B3SG-8 T
GENERAL DESCRIPTION
The MT28F004B3 (x8) and MT28F400B3 (x16/x8)
are nonvolatile, electrically block-erasable (flash), pro-
grammable memory devices containing 4,194,304 bits
organized as 262,144 words (16 bits) or 524,288 bytes (8
bits). Writing or erasing the device is done with either a
3.3V or 5V VPP voltage, while all operations are performed
with a 3.3V VCC. Due to process technology advances,
5V VPP is optimal for application and production pro-
gramming. These devices are fabricated with Micron’s
advanced 0.18µm CMOS floating-gate process.
The MT28F004B3 and MT28F400B3 are organized
into seven separately erasable blocks. To ensure that
critical firmware is protected from accidental erasure or
overwrite, the devices feature a hardware-protected
boot block. Writing or erasing the boot block requires
either applying a super-voltage to the RP# pin or driv-
ing WP# HIGH in addition to executing the normal write
or erase sequences. This block may be used to store
code implemented in low-level system recovery. The
remaining blocks vary in density and are written and
erased with no additional security measures.
Refer to Micron’s Web site (www.micron.com/flash)
for the latest data sheet.
4Mb Smart 3 Boot Block Flash Memory
F45_3.p65 – Rev. 3, Pub. 12/01
1
©2001, Micron Technology, Inc.
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
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MT28F004B3 pdf
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4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
TRUTH TABLE (MT28F400B3)1
FUNCTION
RP# CE# OE# WE# WP# BYTE# A0 A9 VPP DQ0–DQ7 DQ8–DQ14 DQ15/A-1
Standby
H H X X X X X X X High-Z High-Z High-Z
RESET
L X X X X X X X X High-Z High-Z High-Z
READ
READ (word mode)
H L L H X H X X X Data-Out Data-Out Data-Out
READ (byte mode)
H L L H X L X X X Data-Out High-Z A-1
Output Disable
HL
WRITE/ERASE (EXCEPT BOOT BLOCK)2
H H X X X X X High-Z High-Z High-Z
ERASE SETUP
ERASE CONFIRM3
H L H L X X X X X 20h
H L H L X X X X VPPH D0h
X
X
X
X
WRITE SETUP
H L H L X X X X X 10h/40h X
X
WRITE (word mode)4
H L H L X H X X VPPH Data-In Data-In Data-In
WRITE (byte mode)4
H L H L X L X X VPPH Data-In
X
A-1
READ ARRAY5
H L H L X X XX X
FFh
X
X
WRITE/ERASE (BOOT BLOCK)2, 7
ERASE SETUP
H L H L X X X X X 20h
X
X
et4U.com
ERASE CONFIRM3
ERASE CONFIRM3, 6
WRITE SETUP
VHH L H L X X X X VPPH D0h
H L H L H X X X VPPH D0h
H L DaHtaSheLet4UX.comX X X X 10h/40h
X
X
X
X DataShee
X
X
WRITE (word mode)4
VHH L H L X H X X VPPH Data-In Data-In Data-In
WRITE (word mode)4, 6
H L H L H H X X VPPH Data-In Data-In Data-In
WRITE (byte mode)4
VHH L H L X L X X VPPH Data-In
X
A-1
WRITE (byte mode)4, 6
H L H L H L X X VPPH Data-In
X
A-1
READ ARRAY5
H L H L X X XX X
FFh
X
X
DEVICE IDENTIFICATION8, 9
Manufacturer Compatibility
(word mode)10
H L L H X H L VID X
89h
00h
Manufacturer Compatibility
(byte mode)
Device (word mode, top boot)10
HL
HL
L H X L L VID X
L H X H H VID X
89h High-Z
70h 44h
X
Device (byte mode, top boot)
H
Device (word mode, bottom boot) 10 H
L
L
L H X L H VID X
L H X H H VID X
70h High-Z
71h 44h
X
Device (byte mode, bottom boot) H L L H X L H VID X
71h High-Z
X
NOTE: 1. L = VIL (LOW), H = VIH (HIGH), X = VIL or VIH (“Don’t Care”).
2. VPPH = VPPH1 (3.3V) or VPPH2 (5V).
3. Operation must be preceded by ERASE SETUP command.
4. Operation must be preceded by WRITE SETUP command.
5. The READ ARRAY command must be issued before reading the array after writing or erasing.
6. When WP# = VIH, RP# may be at VIH or VHH.
7. VHH = 12V.
8. VID = 12V; may also be read by issuing the IDENTIFY DEVICE command.
9. A1–A8, A10–A17 = VIL.
10. Value reflects DQ8–DQ15.
DataSheet4U.com
4Mb Smart 3 Boot Block Flash Memory
F45_3.p65 – Rev. 3, Pub. 12/01
5 Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.
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MT28F004B3 arduino
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4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
contents on DQ0–DQ7 without prior command. While
the status register contents are read, the outputs are not
updated if there is a change in the ISM status unless OE#
or CE# is toggled. If the device is not in the write, erase,
erase suspend or status register read mode, READ STA-
TUS REGISTER (70h) can be issued to view the status
register contents.
All of the defined bits are set by the ISM, but only the
ISM and erase suspend status bits are reset by the ISM.
The erase, write and VPP status bits must be cleared using
CLEAR STATUS REGISTER. If the VPP status bit (SR3) is
set, the CEL does not allow further WRITE or ERASE
operations until the status register is cleared. This en-
ables the user to choose when to poll and clear the status
register. For example, the host system may perform mul-
tiple BYTE WRITE operations before checking the status
register instead of checking after each individual WRITE.
Asserting the RP# signal or powering down the device
also clears the status register.
ISMS
7
Table 2
Status Register Bit Definitions
ESS ES WS VPPS
6543
R
2–0
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STATUS
BIT #
SR7
SR6
SR5
SR4
SR3
SR0-2
STATUS REGISTER BIT
DESCRIPTION
ISM STATUS (ISMS)
1 = Ready
0 = Busy
The ISMS bit displays the active status of the state machine during
WDRaITtaESohreBeLt4OUC.KcoEmRASE operations. The controlling logic polls this
bit to determine when the erase and write status bits are valid.
ERASE SUSPEND STATUS (ESS)
1 = ERASE suspended
0 = ERASE in progress/completed
Issuing an ERASE SUSPEND places the ISM in the suspend mode
and sets this and the ISMS bit to “1.” The ESS bit remains “1”
until an ERASE RESUME is issued.
ERASE STATUS (ES)
1 = BLOCK ERASE error
0 = Successful BLOCK ERASE
ES is set to “1” after the maximum number of ERASE cycles is
executed by the ISM without a successful verify. ES is only cleared
by a CLEAR STATUS REGISTER command or after a RESET.
WRITE STATUS (WS)
WS is set to “1” after the maximum number of WRITE cycles is
1 = WORD/BYTE WRITE error
executed by the ISM without a successful verify. WS is only cleared
0 = Successful WORD/BYTE WRITE by a CLEAR STATUS REGISTER command or after a RESET.
VPP STATUS (VPPS)
1 = No VPP voltage detected
0 = VPP present
VPPS detects the presence of a VPP voltage. It does not monitor VPP
continuously, nor does it indicate a valid VPP voltage. The VPP pin is
sampled for 3.3V or 5V after WRITE or ERASE CONFIRM is given.
VPPS must be cleared by CLEAR STATUS REGISTER or by a RESET.
RESERVED
Reserved for future use.
DataShee
DataSheet4U.com
4Mb Smart 3 Boot Block Flash Memory
F45_3.p65 – Rev. 3, Pub. 12/01
D a t a S4 Uh. ec eo tm
11
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.

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