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PDF 5962R9580101VXC Data sheet ( Hoja de datos )
| Número de pieza | 5962R9580101VXC | |
| Descripción | Logic Gate | |
| Fabricantes | Intersil | |
| Logotipo |  |
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REVISIONS
A Changes in accordance with NOR 5962-R124-98 - thl.
B Update boilerplate to MIL-PRF-38535 requirements. Editorial changes
throughout. – jak
98-06-12
04-05-07
Raymond L. Monnin
Thomas M. Hess
DataSheet4U.com
DataShee
REV
SHEET
REV
BBBBB
SHEET
15 16 17 18 19
REV STATUS
REV
OF SHEETS
SHEET
BBBBBBBBBBBBB B
1 2 3 4 5 6 7 8 9 10 11 12 13 14
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
PREPARED BY
Thanh V. Nguyen
CHECKED BY
Thanh V. Nguyen
APPROVED BY
Monica L. Poelking
DRAWING APPROVAL DATE
95-10-31
REVISION LEVEL
B
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
MICROCIRCUIT, DIGITAL, RADIATION
HARDENED, HIGH SPEED CMOS, HEX
INVERTER WITH OPEN DRAIN, MONOLITHIC
SILICON
SIZE
CAGE CODE
A 67268
5962-95801
SHEET
DataSheDeSt4CUC.cFoOmRM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF
19
5962-E128-04
DataSheet4 U .com
1 page  
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3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space
limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the
RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535
and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
et4U.com microcircuit group number 36 (see MIL-PRF-38535, appendix A).
DataSheet4U.com
DataShee
STANDARD
MICROCIRCUIT DRAWING
DataSheet4U.com DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
DataSheet4 U .com
SIZE
A
REVISION LEVEL
B
5962-95801
SHEET
5
5 Page 
www.DataSheet4U.com
TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883, method
5005, table I)
Device class M
1, 7, 9
1, 2, 3, 7, 8, 9, 10, 11
1/
1, 2, 3, 4, 5, 6, 7, 8, 9, 10,
11
1, 2, 3, 7, 8, 9, 10, 11
1, 7, 9
1, 7, 9
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device class Q
1, 7, 9
Device class V
1, 7, 9
1, 2, 3, 7, 8, 9, 10, 11
1/
1, 2, 3, 4, 5, 6, 7, 8, 9,
10, 11
1, 2, 3, 7, 8, 9, 10, 11
1, 2, 3, 7, 8, 9, 10, 11
2/ 3/
1, 2, 3, 4, 5, 6, 7, 8, 9,
10, 11
1, 2, 3, 7, 8, 9, 10, 11 3/
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1/ PDA applies to subgroups 1 and 7.
2/ PDA applies to subgroups 1, 7, 9, and deltas.
3/ Delta limits, as specified in table IIB, shall be required where specified, and the delta
limits shall be completed with reference to the zero hour electrical parameters (see table I).
TABLE IIB. Burn-in and operating life test, Delta parameters (+25°C).
et4U.com
Parameters 1/
Delta limits
ICC +3.0 µA
IOL DataSheet4U.co-1m5%
IOZH ±200 nA
1/ These parameters shall be recorded before and after
the required burn-in and life test to determine delta limits.
DataShee
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005 of MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
STANDARD
MICROCIRCUIT DRAWING
DataSheet4U.com DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
DataShee4t U .com
SIZE
A
REVISION LEVEL
B
5962-95801
SHEET
11
11 Page | ||
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