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STQ-3016Z の電気的特性と機能

STQ-3016ZのメーカーはETCです、この部品の機能は「(STQ-x016Z) Reliability Qualification Report」です。


製品の詳細 ( Datasheet PDF )

部品番号 STQ-3016Z
部品説明 (STQ-x016Z) Reliability Qualification Report
メーカ ETC
ロゴ ETC ロゴ 




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STQ-3016Z Datasheet, STQ-3016Z PDF,ピン配置, 機能
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Reliability Qualification Report
STQ-2016Z - Matte Sn, RoHS compliant
Products Qualified by Similarity
STQ-1016Z SRF-1016Z SRQ-2116Z
STQ-3016Z SRF-2016Z
The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for
inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall
be entirely at the user’s own risk. Data subject to change.
303 S. Technology Ct, Broomfield CO, 80021
Phone: (800) SMI-MMIC
http://www.sirenza.com
Document RQR-104756 Rev. B
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STQ-3016Z pdf, ピン配列
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STQ-2016Z Reliability Qualification Report
V. Qualification Methodology
The Sirenza Microdevices qualification process consists of a series of tests designed to
stress various potential failure mechanisms. This testing is performed to ensure that
Sirenza Microdevices products are robust against potential failure modes that could arise
from the various die and package failure mechanisms stressed. The qualification testing
is based on JESD test methods common to the semiconductor industry. The
manufacturing test specifications are used as the PASS/FAIL criteria for initial and final
DC/RF tests.
VI. Qualification By Similarity
A device can be qualified by similarity to previously qualified products provided that no
new potential failure modes/mechanisms are possible in the new design. The following
products have been qualified by similarity to STQ-2016Z:
STQ-1016Z STQ-3016Z SRF-1016Z SRF-2016Z SRQ-2116Z
VII. Operational Life Testing
Sirenza Microdevices defines operational life testing as a DC biased elevated
temperature test performed at the maximum operational junction temperature limit. For
the STQ-2016Z the maximum operational temperature limit is 150oC. The purpose of the
operational life test is to statistically show that the product operated at its maximum
operational ratings will be reliable by operating several hundred devices for a total time of
1000 hours. The results for this test are expressed in device hours that are calculated by
multiplying the total number of devices passing the test by the number of hours tested.
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STQ-3016Z 電子部品, 半導体
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STQ-2016Z Reliability Qualification Report
Group
C
D
G
F
XI. Qualification Test Results
Test Name
Low Temperature
Storage
High Temperature
Storage
Solderability
Tin Whisker
Test Condition/
Standard
Tamb=-40°C
1000 hours
Tamb=-65°C
1000 hours
Tamb=150°C
1000 hours
JESD22-A103B
Dip & Look
Steam Age Condition C
Dip Condition A, 215°C
JESD22-B102C
Dip & Look
Steam Age Condition C
Dip Condition B, 245°C
JESD22-B102C
Tamb=60°C, 90%RH
1800 hours
NEMI
Sample Size
27
20
27
30
15
10
Results
Pass
Pass
Pass
Pass
Pass
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ページ 合計 : 9 ページ
 
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[ STQ-3016Z データシート.PDF ]


データシートを活用すると、その部品の主な機能と仕様を詳しく理解できます。 ピン構成、電気的特性、動作パラメータ、性能を確認してください。


共有リンク

Link :


部品番号部品説明メーカ
STQ-3016

Direct Quadrature Modulator

Sirenza Microdevices
Sirenza Microdevices
STQ-3016Z

(STQ-x016Z) Reliability Qualification Report

ETC
ETC
STQ-3016Z

Direct Quadrature Modulator

Sirenza Microdevices
Sirenza Microdevices


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