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ispLSI2128VE-250LB208 の電気的特性と機能

ispLSI2128VE-250LB208のメーカーはLattice Semiconductorです、この部品の機能は「3.3V In-System Programmable SuperFAST High Density PLD」です。


製品の詳細 ( Datasheet PDF )

部品番号 ispLSI2128VE-250LB208
部品説明 3.3V In-System Programmable SuperFAST High Density PLD
メーカ Lattice Semiconductor
ロゴ Lattice Semiconductor ロゴ 




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ispLSI2128VE-250LB208 Datasheet, ispLSI2128VE-250LB208 PDF,ピン配置, 機能
ispLSI® 2128VE
3.3V In-System Programmable
SuperFAST™ High Density PLD
Features
• SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
— 6000 PLD Gates
— 128 and 64 I/O Pin Versions, Eight Dedicated Inputs
— 128 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
— 100% Functional, JEDEC and Pinout Compatible
with ispLSI 2128V Devices
• 3.3V LOW VOLTAGE 2128 ARCHITECTURE
— Interfaces with Standard 5V TTL Devices
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
fmax = 250MHz Maximum Operating Frequency
tpd = 4.0ns Propagation Delay
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
— 3.3V In-System Programmability (ISP™) Using
Boundary Scan Test Access Port (TAP)
— Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of Wired-
OR Bus Arbitration Logic
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAS
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COM-
PLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
— Superior Quality of Results
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
Tools, Timing Simulator and ispANALYZER™
— PC and UNIX Platforms
Functional Block Diagram*
Output Routing Pool (ORP)
D7 D6 D5 D4
Output Routing Pool (ORP)
D3 D2 D1 D0
A0 C7
A1 C6
A2
DQ
C5
A3 C4
DQ
Logic
A4
Array
DQ
GLB
C3
A5 C2
DQ
A6 C1
A7 Global Routing Pool (GRP) C0
B0 B1 B2 B3
Output Routing Pool (ORP)
B4 B5 B6 B7
Output Routing Pool (ORP)
*128 I/O Version Shown
Description
0139A/2128VE
The ispLSI 2128VE is a High Density Programmable
Logic Device available in 128 and 64 I/O-pin versions.
The device contains 128 Registers, eight Dedicated
Input pins, three Dedicated Clock Input pins, two dedi-
cated Global OE input pins and a Global Routing Pool
(GRP). The GRP provides complete interconnectivity
between all of these elements. The ispLSI 2128VE
features in-system programmability through the Bound-
ary Scan Test Access Port (TAP) and is 100% IEEE
1149.1 Boundary Scan Testable. The ispLSI 2128VE
offers non-volatile reprogrammability of the logic, as well
as the interconnect to provide truly reconfigurable sys-
tems.
The basic unit of logic on the ispLSI 2128VE device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see Figure 1). There are a total of 32 GLBs in the
ispLSI 2128VE device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
September 2000
2128ve_08
1

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ispLSI2128VE-250LB208 pdf, ピン配列
Specifications ispLSI 2128VE
Absolute Maximum Ratings 1
Supply Voltage Vcc .................................. -0.5 to +5.4V
Input Voltage Applied ............................... -0.5 to +5.6V
Off-State Output Voltage Applied ............ -0.5 to +5.6V
Storage Temperature ................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
SYMBOL
VCC
VIL
VIH
Supply Voltage
Input Low Voltage
Input High Voltage
PARAMETER
Commercial TA = 0°C to + 70°C
Industrial
TA = -40°C to + 85°C
Capacitance (TA=25°C, f=1.0 MHz)
MIN.
3.0
3.0
VSS 0.5
2.0
MAX. UNITS
3.6 V
3.6 V
0.8 V
5.25
V
Table 2-0005/2128VE
SYMBOL
C1
C2
C3
PARAMETER
Dedicated Input Capacitance
I/O Capacitance
Clock and Global Output Enable Capacitance
TYPICAL
8
6
10
UNITS
pf
pf
pf
TEST CONDITIONS
VCC = 3.3V, VIN = 0.0V
VCC = 3.3V, VI/O = 0.0V
VCC = 3.3V, VY = 0.0V
Table 2-0006/2128VE
Erase Reprogram Specifications
PARAMETER
Erase/Reprogram Cycles
MINIMUM
10,000
MAXIMUM
UNITS
Cycles
Table 2-0008/2128VE
3


3Pages


ispLSI2128VE-250LB208 電子部品, 半導体
Specifications ispLSI 2128VE
External Timing Parameters
Over Recommended Operating Conditions
PARAMETER
TEST 3
COND.
#
DESCRIPTION1
-135
-100
UNITS
MIN. MAX. MIN. MAX.
tpd1
A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass
7.5 10.0 ns
tpd2
A 2 Data Propagation Delay
10.0 13.0 ns
fmax
A 3 Clock Frequency with Internal Feedback 2
135 100 MHz
fmax (Ext.)
fmax (Tog.)
4
Clock
Frequency
with
External
Feedback
(1
tsu2 +
)tco1
5 Clock Frequency, Max. Toggle
100 77 MHz
143 100 MHz
tsu1
6 GLB Reg. Setup Time before Clock, 4 PT Bypass
5.0 6.5 ns
tco1
A 7 GLB Reg. Clock to Output Delay, ORP Bypass
4.0 5.0 ns
th1 8 GLB Reg. Hold Time after Clock, 4 PT Bypass
0.0 0.0 ns
tsu2
9 GLB Reg. Setup Time before Clock
6.0 8.0 ns
tco2
A 10 GLB Reg. Clock to Output Delay
5.0 6.0 ns
th2 11 GLB Reg. Hold Time after Clock
0.0 0.0 ns
tr1 A 12 Ext. Reset Pin to Output Delay, ORP Bypass
9.0 12.5 ns
trw1
13 Ext. Reset Pulse Duration
5.0 6.5 ns
tptoeen
B 14 Input to Output Enable
12.0 15.0 ns
tptoedis
C 15 Input to Output Disable
12.0 15.0 ns
tgoeen
B 16 Global OE Output Enable
7.0 9.0 ns
tgoedis
C 17 Global OE Output Disable
7.0 9.0 ns
twh 18 External Synchronous Clock Pulse Duration, High
3.5 5.0 ns
twl 19 External Synchronous Clock Pulse Duration, Low
3.5 5.0 ns
1. Unless noted otherwise, all parameters use a GRP load of four, 20 PTXOR path, ORP and Y0 clock.
2. Standard 16-bit counter using GRP feedback.
3. Reference Switching Test Conditions section.
Table 2-0030B/2128VE
v.1.0
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部品番号部品説明メーカ
ispLSI2128VE-250LB208

3.3V In-System Programmable SuperFAST High Density PLD

Lattice Semiconductor
Lattice Semiconductor


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