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ispLSI2032VE-225LB49 の電気的特性と機能

ispLSI2032VE-225LB49のメーカーはLattice Semiconductorです、この部品の機能は「3.3V In-System Programmable High Density SuperFAST PLD」です。


製品の詳細 ( Datasheet PDF )

部品番号 ispLSI2032VE-225LB49
部品説明 3.3V In-System Programmable High Density SuperFAST PLD
メーカ Lattice Semiconductor
ロゴ Lattice Semiconductor ロゴ 




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ispLSI2032VE-225LB49 Datasheet, ispLSI2032VE-225LB49 PDF,ピン配置, 機能
ispLSI® 2032VE
3.3V In-System Programmable
High Density SuperFAST™ PLD
Features
• SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
— 1000 PLD Gates
— 32 I/O Pins, Two Dedicated Inputs
— 32 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
— 100% Functional, JEDEC and Pinout Compatible
with ispLSI 2032V Devices
• 3.3V LOW VOLTAGE 2032 ARCHITECTURE
— Interfaces With Standard 5V TTL Devices
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
fmax = 225 MHz Maximum Operating Frequency
tpd = 4.0 ns Propagation Delay
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
— 3.3V In-System Programmability Using Boundary
Scan Test Access Port (TAP)
— Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of
Wired-OR or Bus Arbitration Logic
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAs
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COM-
PLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
— Superior Quality of Results
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
Tools, Timing Simulator and ispANALYZER™
— PC and UNIX Platforms
Functional Block Diagram
A0
Global Routing Pool
(GRP)
A1
A2 GLB
A3
DQ
Logic D Q
Array D Q
DQ
A7
A6
A5
A4
Description
0139Bisp/2000
The ispLSI 2032VE is a High Density Programmable
Logic Device that can be used in both 3.3V and 5V
systems. The device contains 32 Registers, 32 Universal
I/O pins, two Dedicated Input Pins, three Dedicated
Clock Input Pins, one dedicated Global OE input pin and
a Global Routing Pool (GRP). The GRP provides
complete interconnectivity between all of these elements.
The ispLSI 2032VE features in-system programmability
through the Boundary Scan Test Access Port (TAP) and
is 100% IEEE 1149.1 Boundary Scan Testable. The
ispLSI 2032VE offers non-volatile reprogrammability of
the logic, as well as the interconnect to provide truly
reconfigurable systems.
The basic unit of logic on the ispLSI 2032VE device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. A7 (see Figure 1). There are a total of eight GLBs in the
ispLSI 2032VE device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
September 2000
2032ve_07
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ispLSI2032VE-225LB49 pdf, ピン配列
Specifications ispLSI 2032VE
Absolute Maximum Ratings 1
Supply Voltage Vcc .................................. -0.5 to +5.4V
Input Voltage Applied ............................... -0.5 to +5.6V
Off-State Output Voltage Applied ............ -0.5 to +5.6V
Storage Temperature .............................. -65 to +150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
SYMBOL
VCC
VIL
VIH
Supply Voltage
Input Low Voltage
Input High Voltage
PARAMETER
Commercial TA = 0°C to + 70°C
Industrial
TA = -40°C to + 85°C
MIN.
3.0
3.0
VSS 0.5
2.0
MAX. UNITS
3.6 V
3.6 V
0.8 V
5.25
V
Table 2-0005/2032VE
Capacitance (TA=25°C, f=1.0 MHz)
SYMBOL
C1
C2
C3
PARAMETER
Dedicated Input Capacitance
I/O Capacitance
Clock Capacitance
TYPICAL
8
6
10
UNITS
pf
pf
pf
TEST CONDITIONS
VCC = 3.3V, VIN = 0.0V
VCC = 3.3V, VI/O = 0.0V
VCC = 3.3V, VY = 0.0V
Table 2-0006/2032VE
Erase Reprogram Specifications
PARAMETER
Erase/Reprogram Cycles
MINIMUM
10,000
MAXIMUM
UNITS
Cycles
Table 2-0008A/2032VE
3


3Pages


ispLSI2032VE-225LB49 電子部品, 半導体
Specifications ispLSI 2032VE
External Timing Parameters
Over Recommended Operating Conditions
PARAMETER
TEST 3
COND.
#
DESCRIPTION1
-135
-110
UNITS
MIN. MAX. MIN. MAX.
tpd1
A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass
7.5 10.0 ns
tpd2
A 2 Data Propagation Delay
10.0 13.0 ns
fmax
A 3 Clock Frequency with Internal Feedback 2
135 111 MHz
fmax (Ext.)
fmax (Tog.)
4
Clock
Frequency
with
External
Feedback
(1
tsu2 +
)tco1
5 Clock Frequency, Max. Toggle
100 77.0
167 125
MHz
MHz
tsu1
6 GLB Reg. Setup Time before Clock, 4 PT Bypass
4.0 5.5 ns
tco1
A 7 GLB Reg. Clock to Output Delay, ORP Bypass
4.5 5.0 ns
th1 8 GLB Reg. Hold Time after Clock, 4 PT Bypass
0.0 0.0 ns
tsu2
9 GLB Reg. Setup Time before Clock
5.5 7.5 ns
tco2
A 10 GLB Reg. Clock to Output Delay
5.5 6.5 ns
th2 11 GLB Reg. Hold Time after Clock
0.0 0.0 ns
tr1 A 12 Ext. Reset Pin to Output Delay, ORP Bypass
9.0 12.5 ns
trw1
13 Ext. Reset Pulse Duration
5.0 6.5 ns
tptoeen
B 14 Input to Output Enable
12.0 14.5 ns
tptoedis
C 15 Input to Output Disable
12.0 14.5 ns
tgoeen
B 16 Global OE Output Enable
6.0 7.0 ns
tgoedis
C 17 Global OE Output Disable
6.0 7.0 ns
twh 18 External Synchronous Clock Pulse Duration, High
3.0 4.0 ns
twl 19 External Synchronous Clock Pulse Duration, Low
3.0 4.0 ns
1. Unless noted otherwise, all parameters use a GRP load of 4, 20 PTXOR path, ORP and Y0 clock.
2. Standard 16-bit counter using GRP feedback.
3. Reference Switching Test Conditions section.
Table 2-0030B/2032VL
6

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部品番号部品説明メーカ
ispLSI2032VE-225LB49

3.3V In-System Programmable High Density SuperFAST PLD

Lattice Semiconductor
Lattice Semiconductor


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