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PDF ispGDX80VA-5T100 Data sheet ( Hoja de datos )

Número de pieza ispGDX80VA-5T100
Descripción In-System Programmable 3.3V Generic Digital CrosspointTM
Fabricantes Lattice Semiconductor 
Logotipo Lattice Semiconductor Logotipo



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No Preview Available ! ispGDX80VA-5T100 Hoja de datos, Descripción, Manual

ispGDXTM80VA
In-System Programmable
3.3V Generic Digital CrosspointTM
Features
Functional Block Diagram
• IN-SYSTEM PROGRAMMABLE GENERIC DIGITAL
CROSSPOINT FAMILY
— Advanced Architecture Addresses Programmable
PCB Interconnect, Bus Interface Integration and
Jumper/Switch Replacement
— “Any Input to Any Output” Routing
— Fixed HIGH or LOW Output Option for Jumper/DIP
Switch Emulation
— Space-Saving PQFP and BGA Packaging
— Dedicated IEEE 1149.1-Compliant Boundary Scan
Test
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— 3.3V Core Power Supply
— 3.5ns Input-to-Output/3.5ns Clock-to-Output Delay
— 250MHz Maximum Clock Frequency
— TTL/3.3V/2.5V Compatible Input Thresholds and
Output Levels (Individually Programmable)
— Low-Power: 16.5mA Quiescent Icc
— 24mA IOL Drive with Programmable Slew Rate
Control Option
— PCI Compatible Drive Capability
— Schmitt Trigger Inputs for Noise Immunity
— Electrically Erasable and Reprogrammable
— Non-Volatile E2CMOS Technology
• ispGDXV™ OFFERS THE FOLLOWING ADVANTAGES
— 3.3V In-System Programmable Using Boundary Scan
Test Access Port (TAP)
— Change Interconnects in Seconds
• FLEXIBLE ARCHITECTURE
— Combinatorial/Latched/Registered Inputs or Outputs
— Individual I/O Tri-state Control with Polarity Control
— Dedicated Clock/Clock Enable Input Pins (two) or
Programmable Clocks/Clock Enables from I/O Pins (20)
— Single Level 4:1 Dynamic Path Selection (Tpd = 3.5ns)
— Programmable Wide-MUX Cascade Feature
Supports up to 16:1 MUX
— Programmable Pull-ups, Bus Hold Latch and Open
Drain on I/O Pins
— Outputs Tri-state During Power-up (“Live Insertion”
Friendly)
• DESIGN SUPPORT THROUGH LATTICE’S ispGDX
DEVELOPMENT SOFTWARE
— MS Windows or NT / PC-Based or Sun O/S
— Easy Text-Based Design Entry
— Automatic Signal Routing
— Program up to 100 ISP Devices Concurrently
— Simulator Netlist Generation for Easy Board-Level
Simulation
I/O Pins D
ISP
Control
I/O
Cells
Global Routing
Pool
(GRP)
I/O
Cells
Boundary
Scan
Control
I/O Pins B
Description
The ispGDXVA architecture provides a family of fast,
flexible programmable devices to address a variety of
system-level digital signal routing and interface require-
ments including:
• Multi-Port Multiprocessor Interfaces
• Wide Data and Address Bus Multiplexing
(e.g. 16:1 High-Speed Bus MUX)
• Programmable Control Signal Routing
(e.g. Interrupts, DMAREQs, etc.)
• Board-Level PCB Signal Routing for Prototyping or
Programmable Bus Interfaces
The devices feature fast operation, with input-to-output
signal delays (Tpd) of 3.5ns and clock-to-output delays of
3.5ns.
The architecture of the devices consists of a series of
programmable I/O cells interconnected by a Global Rout-
ing Pool (GRP). All I/O pin inputs enter the GRP directly
or are registered or latched so they can be routed to the
required I/O outputs. I/O pin inputs are defined as four
sets (A,B,C,D) which have access to the four MUX inputs
Copyright © 2000 Lattice Semiconductor Corporation. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein
are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8037; http://www.latticesemi.com
September 2000
gdx80va_02
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ispGDX80VA-5T100 pdf
Specifications ispGDX80VA
Figure 3. Adjacent I/O Cells vs. Direct Input Path for
ispGDX80VA, I/O D13
I/O Group A
D11 MUX Out
I/O Group B
D12 MUX Out
I/O Group C
D14 MUX Out
I/O Group D
D15 MUX Out
ispGDX80VA I/O Cell
4x4
Crossbar
Switch
S1 S0
.m0
.m1
D13
.m2
.m3
It can be seen from Figure 3 that if the D11 adjacent I/O
cell is used, the I/O group Ainput is no longer available
as a direct MUX input.
The ispGDXVA can implement MUXes up to 16 bits wide
in a single level of logic, but care must be taken when
combining adjacent I/O cell outputs with direct MUX
inputs. Any particular combination of adjacent I/O cells as
MUX inputs will dictate what I/O groups (A, B, C or D) can
be routed to the remaining inputs. By properly choosing
the adjacent I/O cells, all of the MUX inputs can be
utilized.
Special Features
Slew Rate Control
All output buffers contain a programmable slew rate
control that provides software-selectable slew rate op-
tions.
Open Drain Control
All output buffers provide a programmable Open-Drain
option which allows the user to drive system level reset,
interrupt and enable/disable lines directly without the
need for an off-chip Open-Drain or Open-Collector buffer.
Wire-OR logic functions can be performed at the printed
circuit board level.
Pull-up Resistor
All pins have a programmable active pull-up. A typical
resistor value for the pull-up ranges from 50kto 80k.
Output Latch (Bus Hold)
All pins have a programmable circuit that weakly holds
the previously driven state when all drivers connected to
the pin (including the pin's output driver as well as any
other devices connected to the pin by external bus) are
tristated.
Table 2. Adjacent I/O Cells (Mapping of
ispGDX80VA)
Data A/ Data B/ Data C/ Data D/
MUXOUT MUXOUT MUXOUT MUXOUT
B10 B12 B11
B9
B8
B11 B13 B12 B10
B9
B12 B14 B13 B11 B10
Reflected B13 B15 B14 B12 B11
I/O Cells D6 D8 D7 D5 D4
D7 D9 D8 D6 D5
D8 D10 D9 D7 D6
D9 D11 D10 D8
D7
D10 D8
D9 D11 D12
D11 D9 D10 D12 D13
D12 D10 D11 D13 D14
Normal D13 D11 D12 D14 D15
I/O Cells
B6 B4 B5 B7 B8
B7 B5 B6 B8 B9
B8 B6 B7 B9 B10
B9 B7 B8 B10 B11
User-Programmable I/Os
The ispGDX80VA features user-programmable
I/Os supporting either 3.3V or 2.5V output voltage level
options. The ispGDX80VA uses a VCCIO pin to provide
the 2.5V reference voltage when used.
PCI Compatible Drive Capability
The ispGDX80VA supports PCI compatible drive capa-
bility for all I/Os.
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ispGDX80VA-5T100 arduino
Specifications ispGDX80VA
External Timing Parameters
Over Recommended Operating Conditions
TEST1
PARAMETER COND. #
DESCRIPTION
-3
-5
UNITS
MIN. MAX. MIN. MAX.
tpd2 A 1 Data Prop. Delay from Any I/O pin to Any I/O Pin (4:1 MUX)
3.5 5.0 ns
tsel2
A 2 Data Prop. Delay from MUXsel Inputs to Any Output (4:1 MUX)
3.5 5.0 ns
fmax (Tog.) 3 Clock Frequency, Max. Toggle
250 143 MHz
fmax (Ext.)
4
Clock Frequency with External Feedback (
1
tsu3+tgco1
)
166.7 111 MHz
tsu1
tsu2
5 Input Latch or Register Setup Time Before Yx
6 Input Latch or Register Setup Time Before I/O Clock
3.0
2.5
4.0
3.0
ns
ns
tsu3
tsu4
7 Output Latch or Register Setup Time Before Yx
8 Output Latch or Register Setup Time Before I/O Clock
2.5
2.0
4.0
3.0
ns
ns
tsuce1
tsuce2
9 Global Clock Enable Setup Time Before Yx
10 Global Clock Enable Setup Time Before I/O Clock
2.5
1.5
2.5
1.5
ns
ns
tsuce3
th1
th2
11 I/O Clock Enable Setup Time Before Yx
12 Input Latch or Reg. Hold Time (Yx)
13 Input Latch or Reg. Hold Time (I/O Clock)
3.0
0.0
0.5
4.5
0.0
1.5
ns
ns
ns
th3 14 Output Latch or Reg. Hold Time (Yx)
th4 15 Output Latch or Reg. Hold Time (I/O Clock)
0.0
1.0
0.0
1.5
ns
ns
thce1
thce2
16 Global Clock Enable Hold Time (Yx)
17 Global Clock Enable Hold Time (I/O Clock)
0.0
1.0
0.0
1.5
ns
ns
thce3
tgco12
tgco22
tco12
18 I/O Clock Enable Hold Time (Yx)
A 19 Output Latch or Reg. Clock (from Yx) to Output Delay
A 20 Input Latch or Register Clock (from Yx) to Output Delay
A 21 Output Latch or Register Clock (from I/O pin) to Output Delay
0.0 0.0
3.5 5.0
6.0 8.5
4.0 6.0
ns
ns
ns
ns
tco22
A 22 Input Latch or Register Clock (from I/O pin) to Output Delay
7.0 9.5 ns
ten2 B 23 Input to Output Enable
5.0 6.0 ns
tdis2
C 24 Input to Output Disable
5.0 6.0 ns
ttoeen2
B 25 Test OE Output Enable
6.0 6.0 ns
ttoedis2
C 26 Test OE Output Disable
6.0 6.0 ns
twh 27 Clock Pulse Duration, High
2.0 3.5 ns
twl 28 Clock Pulse Duration, Low
2.0 3.5 ns
trst 29 Register Reset Delay from RESET Low
8.0 14.0 ns
trw 30 Reset Pulse Width
5.0 10.0 ns
tsl
D 31 Output Delay Adder for Output Timings Using Slow Slew Rate
3.5 5.0 ns
tsk A 32 Output Skew (tgco1 Across Chip)
0.5 0.5 ns
1. All timings measured with one output switching, fast output slew rate setting, except tsl.
2. The delay parameters are measured with Vcc as I/O voltage reference. An additional 0.5ns delay is incurred when Vccio is
used as I/O voltage reference.
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