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PDF 74F1241 Data sheet ( Hoja de datos )
| Número de pieza | 74F1241 | |
| Descripción | Octal inverter buffer 3-State | |
| Fabricantes | NXP Semiconductors | |
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INTEGRATED CIRCUITS
74F1240
Octal inverter buffer (3-State)
74F1241
Octal buffer (3-State)*
* Discontinued part. Please see the Discontinued Product List.
Product specification
Supercedes data of 1989 Apr 04
IC15 Data Handbook
1999 Jan 08
Philips
Semiconductors
1 page  
Philips Semiconductors
Buffers
Product specification
74F1240, 74F1241*
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
MIN
NOM
MAX
4.5 5.0 5.5
2.0
0.8
–18
–15
64
0 +70
UNIT
V
V
V
mA
mA
mA
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP MAX
VOH High-level output voltage
VOL Low-level output voltage
VCC = MIN
VIL = MAX
VIH = MIN
VCC = MIN
VIL = MAX
VIH = MIN
IOH = –3mA
IOH = –15mA
IOL = 48mA
IOL = 64mA
±10% VCC
±5% VCC
±10% VCC
±5% VCC
±10% VCC
±5% VCC
2.4
2.7
2.0
2.0
3.3
0.38 0.55
0.42 0.55
V
V
V
V
V
V
VIK
II
IIH
IIL
IOZH
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off-state output current,
High-level voltage applied
VCC = MIN, II = IIK
VCC = 0.0V, VI = 7.0V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
–0.73
–1.2
100
20
–20
50
V
µA
µA
µA
µA
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50 µA
IOS Short-circuit output current3
VCC = MAX
–100
–225 mA
ICCH
22 30 mA
74F1240 ICCL VCC = MAX
58 75 mA
ICC Supply current (total)
ICCZ
ICCH
44 58 mA
33 44 mA
74F1241 ICCL VCC = MAX
62 80 mA
ICCZ
45 60 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
* Discontinued part. Please see the Discontinued Products List.
1999 Jan 08
5
5 Page | ||
| Páginas | Total 10 Páginas | |
| PDF Descargar | [ Datasheet 74F1241.PDF ] | |
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