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5962F9671101VYC の電気的特性と機能

5962F9671101VYCのメーカーはIntersil Corporationです、この部品の機能は「Radiation Hardened EDAC (Error Detection and Correction Circuit)」です。


製品の詳細 ( Datasheet PDF )

部品番号 5962F9671101VYC
部品説明 Radiation Hardened EDAC (Error Detection and Correction Circuit)
メーカ Intersil Corporation
ロゴ Intersil Corporation ロゴ 




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5962F9671101VYC Datasheet, 5962F9671101VYC PDF,ピン配置, 機能
ACS630MS
January 1996
Radiation Hardened EDAC
(Error Detection and Correction Circuit)
Features
Pinouts
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in
SMD# 5962-96711 and Intersil’ QM Plan
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day
(Typ)
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg
• Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse
• Dose Rate Survivability . . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55oC to +125oC
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current 1µA at VOL, VOH
• Fast Propagation Delay . . . . . . . . . . . . . . . . 37ns (Max), 24ns (Typ)
28 PIN CERAMIC DUAL-IN-LINE, MIL-STD-1835
DESIGNATOR CDIP2-T28, LEAD FINISH C
TOP VIEW
DEF 1
DB0 2
DB1 3
DB2 4
DB3 5
DB4 6
DB5 7
DB6 8
DB7 9
DB8 10
DB9 11
DB10 12
DB11 13
GND 14
28 VCC
27 SEF
26 S1
25 S0
24 CB0
23 CB1
22 CB2
21 CB3
20 CB4
19 CB5
18 DB15
17 DB14
16 DB13
15 DB12
Description
The Intersil ACS630MS is a Radiation Hardened 16-bit parallel error
detection and correction circuit. It uses a modified Hamming code to
generate a 6-bit check word from each 16-bit data word. The check word
is stored with the data word during a memory write cycle; during a
memory read cycle a 22-bit word is taken form memory and checked for
errors. Single bit errors in the data words are flagged and corrected.
Single bit errors in check words are flagged but not corrected. The
position of the incorrect bit is pinpointed, in both cases, by the 6-bit error
syndrome code which is output during the error correction cycle.
The ACS630MS utilizes advanced CMOS/SOS technology to achieve
high-speed operation. This device is a member of a radiation hardened,
high-speed, CMOS/SOS Logic Family.
The ACS630MS is supplied in a 28 lead Ceramic Flatpack (K suffix) or a
28 Lead Ceramic Dual-In-Line Package (D suffix).
28 PIN CERAMIC FLATPACK, MIL-STD-1835
DESIGNATOR CDFP3-F28, LEAD FINISH C
TOP VIEW
DEF
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
DB10
DB11
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28 VCC
27 SEF
26 S1
25 S0
24 CB0
23 CB1
22 CB2
21 CB3
20 CB4
19 CB5
18 DB15
17 DB14
16 DB13
15 DB12
Ordering Information
PART NUMBER
5962F9671101VXC
5962F9671101VYC
ACS630D/Sample
ACS630K/Sample
ACS630HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
25oC
25oC
25oC
SCREENING LEVEL
MIL-PRF-38535 Class V
MIL-PRF-38535 Class V
Sample
Sample
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
1
PACKAGE
28 Lead SBDIP
28 Lead Ceramic Flatpack
28 Lead SBDIP
28 Lead Ceramic Flatpack
Die
Spec Number 518781
File Number 3199.1

1 Page





5962F9671101VYC pdf, ピン配列
ACS630MS
Die Characteristics
DIE DIMENSIONS:
171 mils x 159 mils
4340mm x 4040mm
METALLIZATION:
Type: AlSi
Metal 1 Thickness: 7.125kÅ ±1.125kÅ
Metal 2 Thickness: 9kÅ ±1kÅ
GLASSIVATION:
Type: SiO2
Thickness: 8kÅ ±1kÅ
WORST CASE CURRENT DENSITY:
<2.0 x 105A/cm2
BOND PAD SIZE:
110µm x 110µm
4.4 mils x 4.4 mils
Metallization Mask Layout
ACS630MS
DB2 DB1 DB0 DEF VCC SEF S1
(4) (3) (2) (1) (28) (27) (26)
DB3 (5)
DB4 (6)
DB5 (7)
DB6 (8)
DB7 (9)
DB8 (10)
DB9 (11)
(25) S0
(24) CB0
(23) CB1
(22) CB2
(21) CB3
(20) CB4
(19) CB5
(12) (13) (14) (15) (16) (17) (118)
DB10 DB11 GND DB12 DB13 DB14 DB15
3
Spec Number 518781


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部品番号部品説明メーカ
5962F9671101VYC

Radiation Hardened EDAC (Error Detection and Correction Circuit)

Intersil Corporation
Intersil Corporation


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