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FQA34N20L の電気的特性と機能

FQA34N20LのメーカーはFairchild Semiconductorです、この部品の機能は「200V LOGIC N-Channel MOSFET」です。


製品の詳細 ( Datasheet PDF )

部品番号 FQA34N20L
部品説明 200V LOGIC N-Channel MOSFET
メーカ Fairchild Semiconductor
ロゴ Fairchild Semiconductor ロゴ 




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FQA34N20L Datasheet, FQA34N20L PDF,ピン配置, 機能
FQA34N20L
200V LOGIC N-Channel MOSFET
June 2000
QFETTM
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switching DC/DC converters,
switch mode power supply, motor control.
Features
• 34A, 200V, RDS(on) = 0.075@VGS = 10 V
• Low gate charge ( typical 55 nC)
• Low Crss ( typical 52 pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
• Low level gate drive requirement allowing direct
opration from logic drivers
G DS
TO-3P
FQA Series
D
!
"
!"
G!
"
"
!
S
Absolute Maximum Ratings TC = 25°C unless otherwise noted
Symbol
VDSS
ID
IDM
VGSS
EAS
IAR
EAR
dv/dt
PD
TJ, TSTG
TL
Parameter
Drain-Source Voltage
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
Drain Current - Pulsed
(Note 1)
Gate-Source Voltage
Single Pulsed Avalanche Energy
(Note 2)
Avalanche Current
(Note 1)
Repetitive Avalanche Energy
(Note 1)
Peak Diode Recovery dv/dt
(Note 3)
Power Dissipation (TC = 25°C)
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
FQA34N20L
200
34
21
136
± 20
640
34
21
5.5
210
1.67
-55 to +150
300
Thermal Characteristics
Symbol
RθJC
RθCS
RθJA
Parameter
Thermal Resistance, Junction-to-Case
Thermal Resistance, Case-to-Sink
Thermal Resistance, Junction-to-Ambient
Typ
--
0.24
--
Max
0.6
--
40
©2000 Fairchild Semiconductor International
Units
V
A
A
A
V
mJ
A
mJ
V/ns
W
W/°C
°C
°C
Units
°C/W
°C/W
°C/W
Rev. A, June 2000

1 Page





FQA34N20L pdf, ピン配列
Typical Characteristics
102 Top :
V
GS
10.0 V
8.0 V
6.0 V
5.0 V
4.5 V
4.0 V
3.5 V
Bottom : 3.0 V
101
100
10-1
Notes :
1. 250μs Pulse Test
2. T = 25
C
100
V , Drain-Source Voltage [V]
DS
101
Figure 1. On-Region Characteristics
0.25
0.20
V = 5V
GS
0.15
V = 10V
GS
0.10
0.05
0.00
0
Note : T = 25
J
30 60 90
ID, Drain Current [A]
120
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
7000
6300
5600
4900
4200
3500
2800
2100
1400
700
0
10-1
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
C
iss
C
oss
C
rss
Notes :
1. VGS = 0 V
2. f = 1 MHz
100 101
VDS, Drain-Source Voltage [V]
Figure 5. Capacitance Characteristics
©2000 Fairchild Semiconductor International
102
101
150
100
25
10-1
0
-55
Notes :
1. VDS = 30V
2. 250μs Pulse Test
2468
V , Gate-Source Voltage [V]
GS
10
Figure 2. Transfer Characteristics
102
101
100
10-1
0.2
15025
Notes :
1. V = 0V
GS
2. 250μs Pulse Test
0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VSD, Source-Drain voltage [V]
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
12
10
V = 40V
DS
V = 100V
8 DS
VDS = 160V
6
4
2
Note : ID = 34 A
0
0 20 40 60 80 100 120
QG, Total Gate Charge [nC]
Figure 6. Gate Charge Characteristics
Rev. A, June 2000


3Pages


FQA34N20L 電子部品, 半導体
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
Same Type
as DUT
• dv/dt controlled by RG
• ISD controlled by pulse period
VDD
VGS
( Driver )
I SD
( DUT )
VDS
( DUT )
D
=
--G--a--t-e--P--u--l-s-e---W---i-d-t-h--
Gate Pulse Period
10V
IFM , Body Diode Forward Current
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VSD
Body Diode
Forward Voltage Drop
VDD
©2000 Fairchild Semiconductor International
Rev. A, June 2000

6 Page



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共有リンク

Link :


部品番号部品説明メーカ
FQA34N20

200V N-Channel MOSFET

Fairchild Semiconductor
Fairchild Semiconductor
FQA34N20L

200V LOGIC N-Channel MOSFET

Fairchild Semiconductor
Fairchild Semiconductor


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