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100302 の電気的特性と機能

100302のメーカーはNational Semiconductorです、この部品の機能は「Low Power Quint 2-Input OR/NOR Gate」です。


製品の詳細 ( Datasheet PDF )

部品番号 100302
部品説明 Low Power Quint 2-Input OR/NOR Gate
メーカ National Semiconductor
ロゴ National Semiconductor ロゴ 




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100302 Datasheet, 100302 PDF,ピン配置, 機能
August 1998
100302
Low Power Quint 2-Input OR/NOR Gate
General Description
The 100302 is a monolithic quint 2-input OR/NOR gate with
common enable. All inputs have 50 kpull-down resistors
and all outputs are buffered.
Features
n 43% power reduction of the 100102
n 2000V ESD protection
n Pin/function compatible with 100102
n Voltage compensated operating range = −4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9152802
Logic Symbol
DS100303-1
Pin Names
Dna– Dne
E
Oa– Oe
Oa– Oe
Description
Data Inputs
Enable Input
Data Outputs
Complementary Data Outputs
Truth Table
D1X D2X E OX OX
L L LL H
L L HH L
L H LH L
L H HH L
H L LH L
H L HH L
H H LH L
H H HH L
H = HIGH Voltage Level
L = LOW Voltage Level
© 1998 National Semiconductor Corporation DS100303
www.national.com

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100302 pdf, ピン配列
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
−65˚C to +150˚C
+175˚C
VEE Pin Potential to
Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
Output Current (DC Output HIGH)
VEE to +0.5V
−50 mA
ESD (Note 2)
2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
Supply Voltage (VEE)
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C (Note 5)
Symbol
Parameter
VOH Output HIGH Voltage
Min
−1025
−1085
Max
−870
−870
Units
mV
mV
TC
0˚C to +125˚C
−55˚C
VOL Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C
−1830 −1555 mV
−55˚C
VOHC
Output HIGH Voltage
−1035
−1085
mV 0˚C to +125˚C
mV −55˚C
VOLC Output LOW Voltage
−1610 mV
−1555 mV
0˚C to +125˚C
−55˚C
VIH
Input HIGH Voltage
−1165 −870 mV −55˚C to +125˚C
VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C
IIL Input LOW Current 0.50
µA −55˚C to +125˚C
IIH Input HIGH Current
240 µA
340 µA
0˚C to +125˚C
−55˚C
IEE Power Supply Current −48 −17 mA −55˚C to +125˚C
Conditions
VIN = VIH(Max)
or VIL (Min)
Loading with
50to −2.0V
VIN = VIH(Max)
or VIL (Min)
Loading with
50to −2.0V
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
VEE = −4.2V
VIN = VIH (Max)
VEE = −5.7V
VIN = VIL(Min)
Inputs Open
Notes
(Notes 3, 4,
5)
(Notes 3, 4,
5)
(Notes 3, 4,
5, 6)
(Notes 3, 4,
5, 6)
(Notes 3, 4,
5)
(Notes 3, 4,
5)
(Notes 3, 4,
5, 6)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = +25˚C
Min Max
TC = +125˚C Units Conditions
Min Max
Notes
tPLH Propagation Delay
tPHL Data to Output
0.30 1.80 0.40 1.50 0.40 1.70 ns
(Notes 7, 8,
9, 10, 11)
tPLH Propagation Delay
tPHL Enable to Output
0.60 2.60 0.80 2.30 0.80 2.80 ns
Figures 1, 2
tTLH Transition Time
0.30 1.20 0.30 1.20 0.30 1.20
ns
tTHL 20% to 80%, 80% to 20%
(Note 10)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
3 www.national.com


3Pages


100302 電子部品, 半導体
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE-
VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI-
CONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or sys- 2. A critical component in any component of a life support
tems which, (a) are intended for surgical implant into
device or system whose failure to perform can be rea-
the body, or (b) support or sustain life, and whose fail-
sonably expected to cause the failure of the life support
ure to perform when properly used in accordance
device or system, or to affect its safety or effectiveness.
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
Americas
Tel: 1-800-272-9959
Fax: 1-800-737-7018
www.national.com
National Semiconductor
Europe
Fax: +49 (0) 1 80-530 85 86
Deutsch Tel: +49 (0) 1 80-530 85 85
English Tel: +49 (0) 1 80-532 78 32
Français Tel: +49 (0) 1 80-532 93 58
Italiano Tel: +49 (0) 1 80-534 16 80
National Semiconductor
Asia Pacific Customer
Response Group
Tel: 65-2544466
Fax: 65-2504466
National Semiconductor
Japan Ltd.
Tel: 81-3-5620-6175
Fax: 81-3-5620-6179
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.

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