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IRF730のメーカーはnELLです、この部品の機能は「N-Channel Power MOSFET / Transistor」です。 |
部品番号 | IRF730 |
| |
部品説明 | N-Channel Power MOSFET / Transistor | ||
メーカ | nELL | ||
ロゴ | |||
このページの下部にプレビューとIRF730ダウンロード(pdfファイル)リンクがあります。 Total 7 pages
SEMICONDUCTOR
IRF730 Series RRooHHSS
Nell High Power Products
N-Channel Power MOSFET
(5.5A, 400Volts)
DESCRIPTION
The Nell IRF730 are N-Channel enhancement mode silicon
gate power field effect transistors. They are designed, tested
and guaranteed to withstand a specified level of energy in the
breakdown avalanche mode of operation.
They are designed as an extremely efficient and reliable
device for use in a wide variety of applications such as
switching regulators. convertors,UPS, switching mode power
supplies and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These transistors can be operated directly from integrated
circuits.
FEATURES
RDS(ON) = 1.00Ω @ VGS = 10V
Ultra low gate charge(22nC Max.)
Low reverse transfer capacitance
(CRSS = 4pF typical)
Fast switching capability
100% avalanche energy specified
Improved dv/dt capability
150°C operation temperature
D
GDS
TO-220AB
(IRF730A)
D (Drain)
G
(Gate)
S (Source)
PRODUCT SUMMARY
ID (A)
VDSS (V)
RDS(ON) (Ω)
QG(nC) max.
5.5
400
1.00 @ VGS = 10V
22
ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise specified)
SYMBOL
PARAMETER
TEST CONDITIONS
VDSS
VDGR
Drain to Source voltage(Note 1)
Drain to Gate voltage
TJ=25°C to 150°C
RGS=20KΩ
VGS Gate to Source voltage
ID Continuous Drain Current
VGS=10V, TC=25°C
VGS=10V, TC=100°C
IDM Pulsed Drain current(Note 1)
IAR Avalanche current(Note 1)
EAR Repetitive avalanche energy(Note 1)
EAS Single pulse avalanche energy(Note 2)
lAR=5.5A, RGS=50Ω, VGS=10V
lAS=5.5A, L=19mH
dv/dt
Peak diode recovery dv/dt(Note 3)
Total power dissipation
PD
Derating factor above 25°C
TC=25°C
TJ Operation junction temperature
TSTG
Storage temperature
TL Maximum soldering temperature, for 10 seconds 1.6mm from case
Mounting torque, #6-32 or M3 screw
Note: 1.Repetitive rating: pulse width limited by junction temperature.
2.VDD ≤ 50V, L=19mH, lAS=5.5A, RG =25Ω, starting TJ =25°C
3.ISD ≤ 5.5A, di/dt ≤ 90A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C.
www.nellsemi.com
Page 1 of 7
VALUE
400
400
±30
5.5
3.5
22
5.5
7.4
290
4.6
75
0.6
-55 to 150
-55 to 150
300
10 (1.1)
UNIT
V
A
mJ
mJ
V /ns
W
W /°C
ºC
lbf.in (N.m)
1 Page SEMICONDUCTOR
ORDERING INFORMATION SCHEME
IRF730 Series RRooHHSS
Nell High Power Products
IRF 730 A
MOSFET series
N-Channel, IR series
Current & Voltage rating, lD & VDS
5.5A / 400V
Package type
A = TO-220AB
Fig.1 Typical output characteristics
100
10
VGS
Top: 15V
10V
8V
7V
6V
5.5V
5V
Bottorm: 4.5V
1
0.1
4.5V
20µs pulse width
0.01
TJ=25°C
0.1 1 10 100
Drain-to-Source voltage, VDS (V)
Fig.2 Typical output characteristics
100
10
VGS
Top: 15V
10V
8V
7V
6V
5.5V
5V
Bottorm: 4.5V
1
4.5V
0.1
20µs pulse width
0.01
TJ=150°C
0.1 1
10 100
Drain-to-Source voltage, VDS (V)
Fig.3 Typical transfer characteristics
103
102
TJ = 150°C
101 TJ = 25°C
1
46
VDS=50V
20µs pulse width
8 10 12
Gate-to-Source voltage, VGS (V)
Fig.4 Normalized On-Resistance vs. Temperature
2.5
lD =5.5A
2.0
1.5
1.0
0.5
VGS=10V
0
-60 -40 -20 0 20 40 60 80 100 120 140 160
Junction Temperature,TJ (°C)
www.nellsemi.com
Page 3 of 7
3Pages SEMICONDUCTOR
Fig.12c. Maximum avalanche energy vs.
Drain current
700
lD
TOP
2.5A
600 3.5A
BOTTOM 5.5A
500
400
300
200
100
0
25 50 75 100 125 150
Junction temperature, TJ (°C)
Fig.13a. Basic gate charge waveform
VGS
10V
QGS
QG
QGD
Charge
IRF730 Series RRooHHSS
Nell High Power Products
Fig.12d. Typical drain-to-source voltage
vs. Avalanche current
610
600
590
580
570
560
550
540
0 123456
Avalanche current, IAV (Α)
Fig.13b. Gate charge test circuit
Current Regulator
Same Type as D.U.T.
50KΩ
12V 0.2µF
0.3µF
VGS
3mA
D.U.T.
+
- VDS
RG RD
Current Sampling Resistors
Fig.14 Peak diode recovery dv/dt test circuit for N-Channel MOSFET
D.U.T.
+ Circuit Layout Considerations
• Low Stray lnductance
• Ground Plane
• Low Leakage lnductance
Current Transformer
-
+
- -+
RG
• dv/dt controlled by RG
• Driver same type as D.U.T.
+
• lSD controlled by Duty Factor "D" - VDD
• D.U.T. -Device Under Test
Driver Gate Drive
P.W.
Period
D=
P.W.
Period
*VGS=10V
D.U.T. I SD Waveform
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
Inductor Curent
Forward Drop
Ripple ≤ 5%
*VGS = 5V for Logic Level Devices
VDD
ISD
www.nellsemi.com
Page 6 of 7
6 Page | |||
ページ | 合計 : 7 ページ | ||
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PDF ダウンロード | [ IRF730 データシート.PDF ] |
データシートを活用すると、その部品の主な機能と仕様を詳しく理解できます。 ピン構成、電気的特性、動作パラメータ、性能を確認してください。 |
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