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74ABT00 の電気的特性と機能

74ABT00のメーカーはPhilipsです、この部品の機能は「Quad 2-input NAND gate」です。


製品の詳細 ( Datasheet PDF )

部品番号 74ABT00
部品説明 Quad 2-input NAND gate
メーカ Philips
ロゴ Philips ロゴ 




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74ABT00 Datasheet, 74ABT00 PDF,ピン配置, 機能
INTEGRATED CIRCUITS
74ABT00
Quad 2-input NAND gate
Product specification
IC23 Data Handbook
Philips
Semiconductors
1995 Sep 18

1 Page





74ABT00 pdf, ピン配列
Philips Semiconductors
Quad 2-input NAND gate
Product specification
74ABT00
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC DC supply voltage
–0.5 to +7.0
V
IIK DC input diode current
VI DC input voltage3
VI < 0
–18
–1.2 to +7.0
mA
V
IOK
VOUT
DC output diode current
DC output voltage3
VO < 0
output in Off or High state
–50
–0.5 to +5.5
mA
V
IOUT
DC output current
output in Low state
40 mA
Tstg Storage temperature range
–65 to 150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VI
VIH
VIL
IOH
IOL
t/v
Tamb
DC supply voltage
Input voltage
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
LIMITS
MIN MAX
4.5 5.5
0 VCC
2.0
0.8
–15
20
05
–40 +85
UNIT
V
V
V
V
mA
mA
ns/V
°C
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = +25°C
MIN TYP MAX
Tamb = –40°C
to +85°C
MIN MAX
VIK Input clamp voltage
VCC = 4.5V; IIK = –18mA
–0.9 –1.2
–1.2
VOH High-level output voltage
VCC = 4.5V; IOH = –15mA; VI = VIL or VIH
2.5 2.9
2.5
VOL Low-level output voltage
VCC = 4.5V; IOL = 20mA; VI = VIL or VIH
0.35 0.5
0.5
II Input leakage current
VCC = 5.5V; VI = GND or 5.5V
±0.01 ±1.0
±1.0
IOFF Power-off leakage current VCC = 0.0V; VO or VI 4.5V
±5.0 ±100
±100
ICEX Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or VCC
5.0 50
50
IO Output current1
VCC = 5.5V; VO = 2.5V
–50 –75 –180 –50 –180
ICC Quiescent supply current
VCC = 5.5V; VI = GND or VCC
2 50
50
ICC
Additional supply current per VCC = 5.5V; One data input at 3.4V, other
input pin2
inputs at VCC or GND
0.25 500
500
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
UNIT
V
V
V
µA
µA
µA
mA
µA
µA
1995 Sep 18
3


3Pages


74ABT00 電子部品, 半導体
Philips Semiconductors
Quad 2-input NAND gate
SO14: plastic small outline package; 14 leads; body width 3.9 mm
Product specification
74ABT00
SOT108-1
1995 Sep 18
6

6 Page



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