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IS43DR32801A の電気的特性と機能

IS43DR32801AのメーカーはISSIです、この部品の機能は「8Mx32 256Mb DDR2 DRAM」です。


製品の詳細 ( Datasheet PDF )

部品番号 IS43DR32801A
部品説明 8Mx32 256Mb DDR2 DRAM
メーカ ISSI
ロゴ ISSI ロゴ 




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IS43DR32801A Datasheet, IS43DR32801A PDF,ピン配置, 機能
IS43DR32800A, IS43/46DR32801A
8Mx32
256Mb DDR2 DRAM
PRELIMINARY INFORMATION
SEPTEMBER 2010
FEATURES
• Vdd = 1.8V ±0.1V, Vddq = 1.8V ±0.1V
• JEDEC standard 1.8V I/O (SSTL_18-compatible)
• Double data rate interface: two data transfers
per clock cycle
• Differential data strobe (DQS, DQS)
• 4-bit prefetch architecture
• On chip DLL to align DQ and DQS transitions
with CK
• 4 internal banks for concurrent operation
• Programmable CAS latency (CL) 3, 4, 5, and 6
supported
• Posted CAS and programmable additive latency
(AL) 0, 1, 2, 3, 4, and 5 supported
• WRITE latency = READ latency - 1 tCK
• Programmable burst lengths: 4 or 8
• Adjustable data-output drive strength, full and
reduced strength options
• On-die termination (ODT)
DESCRIPTION
ISSI's 256Mb DDR2 SDRAM uses a double-data-rate
architecture to achieve high-speed operation. The
double-data rate architecture is essentially a 4n-prefetch
architecture, with an interface designed to transfer two
data words per clock cycle at the I/O balls.
The 256Mb DDR2 SDRAM is provided in a wide bus
x32 format, designed to offer a smaller footprint and
support compact designs.
ADDRESS TABLE
Parameter
Configuration
Refresh Count
Row Addressing
Column
Addressing
Bank Addressing
Precharge
Addressing
8M x 32
Standard Page
Size Option
2M x 32 x 4 banks
4K/64ms
A0-A11
A0-A8
BA0, BA1
A10/AP
8M x 32
Reduced Page
Size Option
2M x 32 x 4 banks
8K/64ms
A0-A12
A0-A7
BA0, BA1
A10/AP
OPTIONS
• Configuration:
8M x 32 (IS43DR32800A Standard Page - 4K
refresh)
8M x 32 (IS43/46DR32801A Reduced Page - 8K
refresh)
• Package: x32: 126 WBGA
KEY TIMING PARAMETERS
Speed Grade -37C -5B
• Timing – Cycle time
3.0ns @CL=5, DDR2-667D
3.75ns @CL=4, DDR2-533C
5.0ns @CL=3, DDR2-400B
• Temperature Range:
Commercial (0°C Tc 85°C; 0°C Ta 70°C)
Industrial (–40°C Tc 95°C; –40°C Ta 85°C)
Automotive, A1 (–40°C Tc 95°C; –40°C Ta 85°C)
Automotive, A2 (–40°C Tc 105°C; –40°C Ta 105°C)
Tc = Case Temp, Ta = Ambient Temp
tRCD
tRP
tRC
tRAS
tCK @CL=3
tCK @CL=4
tCK @CL=5
tCK @CL=6
15 15
15 15
60 55
45 40
55
3.75 5
3.75 5
3.75 5
Copyright © 2010 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without
notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the lat-
est version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reason-
ably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications
unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc. — www.issi.com
Rev.  00E
09/08/2010
1

1 Page





IS43DR32801A pdf, ピン配列
IS43DR32800A, IS43/46DR32801A
pin description table
Symbol
CK, CK
CKE
Type
Input
Input
Function
Clock: CK and CK are differential clock inputs. All address and control input signals
are sampled on the crossing of the positive edge of CK and negative edge of CK.
Output (read) data is referenced to the crossings of CK and CK (both directions of
crossing).
Clock Enable: CKE HIGH activates, and CKE LOW deactivates, internal clock signals
and device input buffers and output drivers. Taking CKE LOW provides Precharge
Power-Down and Self Refresh operation (all banks idle), or Active Power-Down (row
Active in any bank). CKE is synchronous for power down entry and exit, and for self
refresh entry. CKE is asynchronous for self refresh exit. After VREF has become
stable during the power on and initialization sequence, it must be maintained for
proper operation of the CKE receiver. For proper self-refresh entry and exit, VREF
must be maintained to this input. CKE must be maintained HIGH throughout read and
write accesses. Input buffers, excluding CK, CK, ODT and CKE are disabled during
power-down. Input buffers, excluding CKE, are disabled during self refresh.
CS
ODT
Input
Input
Chip Select: All commands are masked when CS is registered HIGH. CS provides for
external Rank selection on systems with multiple Ranks. CS is considered part of the
command code.
On Die Termination: ODT (registered HIGH) enables termination resistance internal
to the DDR2 SDRAM. When enabled, ODT is applied to each DQ, DQS, DQS, DQM
signals. The ODT pin will be ignored if the EMR(1) is programmed to disable ODT.
RAS, CAS, WE Input
(DM0-DM3)
Input
BA0 - BA1
Input
A0 - A12
Input
Command Inputs: RAS, CAS and WE (along with CS) define the command being
entered.
Input Data Mask: DM is an input mask signal for write data. Input data is masked
when DM is sampled HIGH coincident with that input data during a Write access. DM
is sampled on both edges of DQS. Although DM pins are input only, the DM loading
matches the DQ and DQS loading. The function of DM is enabled by EMRS command
to EMR(1).
Bank Address Inputs: BA0 - BA1 define to which bank an Active, Read, Write or
Precharge command is being applied. Bank address also determines if the mode
register or one of the extended mode registers is to be accessed during a MRS or
EMRS command cycle.
Address Inputs: Provide the row address for Active commands and the column
address and Auto Precharge bit for Read/Write commands to select one location
out of the memory array in the respective bank. A10 is sampled during a Precharge
command to determine whether the Precharge applies to one bank (A10 LOW) or all
banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by BA0 -
BA1. The address inputs also provide the op-code during MRS or EMRS commands.
Standard Page option only: A12 is not used for addressing, but is necessary as an
input for the setting of the Mode Register (MRS) and Extended Mode Registers
(EMR). If not implemented for MRS/EMR, A12 can be left connected to Vss. It must
not be left floating.
Integrated Silicon Solution, Inc. — www.issi.com
Rev.  00E
09/08/2010
3


3Pages


IS43DR32801A 電子部品, 半導体
IS43DR32800A, IS43/46DR32801A
electrical specifications
Absolute Maximum DC Ratings
Symbol
Vdd
Vddq
Vddl
Vin, Vout
Tstg
Parameter
Voltage on VDD pin relative to Vss
Voltage on VDDQ pin relative to Vss
Voltage on VDDL pin relative to Vss
Voltage on any pin relative to Vss
Storage Temperature
Rating
- 1.0 V ~ 2.3 V
- 0.5 V ~ 2.3 V
- 0.5 V ~ 2.3 V
- 0.5 V ~ 2.3 V
-55 to +150
Units
V
V
V
V
°C
Notes
1,3
1,3
1,3
1,4
1, 2
Notes:
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to
JESD51-2 standard.
3. VDD and VDDQ must be within 300mV of each other at all times; and VREF must be not greater than 0.6 x VDDQ. When VDD and VDDQ and
VDDL are less than 500 mV, Vref may be equal to or less than 300 mV.
4. Voltage on any input or I/O may not exceed voltage on VDDQ.
AC & DC Recommended Operating Conditions
Recommended DC Operating Conditions (SSTL-1.8)
Symbol Parameter
Rating
Units Notes
Min.
Typ.
Max.
VDD
Supply Voltage
1.7 1.8 1.9 V 1
VDDL Supply Voltage for DLL
1.7
1.8
1.9 V 5
VDDQ Supply Voltage for Output
1.7
1.8
1.9 V 1, 5
VREF
Input Reference Voltage
0.49 x VDDQ 0.50 x VDDQ 0.51 x VDDQ mV 2. 3
VTT Termination Voltage
VREF - 0.04
VREF
VREF + 0.04 V 4
Notes:
1. There is no specific device VDD supply voltage requirement for SSTL_18 compliance. However under all conditions VDDQ must be less than
or equal to VDD.
2. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF is expected to be
about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.
3. Peak to peak ac noise on VREF may not exceed +/-2 % VREF(dc).
4. VTT of transmitting device must track VREF of receiving device.
5. VDDQ tracks with VDD, VDDL tracks with VDD. AC parameters are measured with VDD, VDDQ and VDDDL tied together
6 Integrated Silicon Solution, Inc. — www.issi.com
Rev.  00E
09/08/2010

6 Page



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部品番号部品説明メーカ
IS43DR32801A

8Mx32 256Mb DDR2 DRAM

ISSI
ISSI
IS43DR32801B

8Mx32 256Mb DDR2 DRAM

ISSI
ISSI


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